Dr. Tobias Haist
Group Leader of 3D Metrology at Institut für Technische Optik
SPIE Involvement:
Author | Instructor
Publications (51)

SPIE Journal Paper | 3 December 2020
OE Vol. 59 Issue 12

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Confocal microscopy, Hyperspectral imaging, Optical filters, Speckle, Cameras, Sensors, Colorimetry, 3D metrology, Hyperspectral sensing, Monochromators

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Detection and tracking algorithms, Imaging systems, Cameras, Sensors, Calibration, Image processing, Field programmable gate arrays, Computer generated holography, 3D metrology

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Edge detection, Holograms, Imaging systems, Sensors, Calibration, Image processing, Error analysis, Computer generated holography, Image sensors, Distance measurement

Proceedings Article | 2 March 2020 Presentation + Paper
Proc. SPIE. 11287, Photonic Instrumentation Engineering VII
KEYWORDS: Actuators, Holography, Cameras, Sensors, Control systems, Temporal resolution, Computer generated holography, Image sensors, Adaptive control, Prototyping

Showing 5 of 51 publications
Conference Committee Involvement (9)
Interferometry XX
24 August 2020 | Online Only, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
Digital Optics for Immersive Displays (DOID18)
24 April 2018 | Strasbourg, France
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Showing 5 of 9 Conference Committees
Course Instructor
SC1216: Using Spatial Light Modulators
This course introduces the application of pixelated spatial light modulators (SLM) for imaging and non-imaging applications. First, a review of the different commercially available SLM technologies with their benefits, shortcomings and all relevant parameters will be provided. Also, the addressing of the elements and their characterization is described. Then, focus will be laid on the usage as dynamic diffractive/holographic elements. The attendee will be reminded of the most necessary issues from diffraction theory, linear systems and Fourier optics before learning how to compute and optimize holograms/diffractive optical elements. Finally the applications patterns that enable you to employ SLMs for innovative new designs will be described and we will practice the utilization of these patterns for different optical systems.
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