The use of high-power continuous wave (CW) lasers in the emerging directed energy (DE) market has put greater emphasis on the quality of optical coatings. These coatings (both high reflectance and anti-reflection) require high damage thresholds for use at irradiances up to and greater than 1 MW/cm2. The challenge in the coating process is to minimize the number of coating defects that can contribute to absorption and eventual coating failure. The industry lacks standardized testing to detect possible defects at the required irradiances for DE optics. To aid in the development of coating designs and production techniques for DE related optics, we have constructed a high-irradiance Ytterbium fiber laser-based scanning metrology system to detect absorbing defects in DE optical coatings. Defects are detected by their localized thermal heating creating a hot-spot. The goal of this work is to continually improve the coating, increase the laser damage threshold, and contribute to a standard for the testing and validation of directed energy optical coatings.
Freeform optics can enhance optical performance by reducing the number of elements, enabling lighter and more efficient systems, and by reducing aberrations. Most traditional manufacturing techniques cannot yield polished freeform optical surfaces. Likewise, traditional metrology equipment has difficulty accurately measuring the deviation of freeform surfaces from their nominal shape, the surface form error. The freeform manufacturing process requires control of both the surface form and the surface location simultaneously. The combination of both surface location and form error is referred to as total error. Inclusion of mechanical fiducials on freeform optics allows for precise locating of all surfaces of an optic in reference to one another and provide a reference from which the freeform surface can be measured against. Alignment fiducials enable more precise measurement of total error and can also aid in alignment of the optic in the final assembly and test.
With optical technology and design advances, larger freeform optics are increasingly sought after by consumers for an expanding number of applications. Many techniques have been developed to meet the challenges of producing these nonrotationally symmetric optics, which cannot be fabricated via traditional manufacturing and metrology processes. In the past, methods were established to create smaller freeforms. With demands for more and larger freeforms, manufacturers must scale up existing processes. This paper will present some of the challenges and solutions of extending freeform polishing capabilities from approximately 150 mm diameter parts to a component of over 500 mm in diameter. In fabricating the 500 mm freeform, Optimax has addressed many of the manufacturing and metrology challenges using some proprietary techniques as well as some novel methods. Some of the approaches explored in this paper include acquisition of a substrate blank of sufficient dimensions, material handling logistics, polishing strategies, and metrology. Earlier freeform polishing projects at Optimax utilized a smaller pick-and-place style, 6-axis robotic arm. The route to design, build, and program a scaled-up polishing robotic arm is discussed. Considerations for polishing path planning and metrology are explained. In addition, deflectometry, a non-interferometric measurement method using fringe reflection and ray tracing, has been developed in parallel to help measure mid-spatial frequency error on a part surface faster and more safely than traditional methods, as it can be done in-situ.
Freeform optics have emerged as a new tool for optical designers and integrators. Manufacturing innovations are gradually increasing availability of precision freeform optics. As optics manufacturers strive to improve quality and decrease cost, some focus is placed on improvements in the challenging metrology requirements for freeforms. One relevant technique to be discussed here is the use of deflectometry to measure mid-spatial frequency error in-process or in-situ during the manufacturing of freeform parts. Deflectometry can measure the mid-spatial frequency error on freeform parts orders of magnitude faster than traditional tactile metrology tools at similar or better accuracy.
Freeform optical components are gaining popularity with designers due to their ability to improve optical and aerodynamic performance for many applications. The challenges involved with the manufacturing and metrology of these shapes, which have little or no symmetry, has been discussed at previous talks and conferences. This paper will focus on the challenges that Optimax faced as we scaled up our freeform polishing process from parts with approximately 150 mm diameters, to polishing components with diameters over 600 mm. The large format platform, designed, built, and programmed at Optimax, utilizes a pick-and-place style, 6-axis robotic arm for the polishing motion. In order to scale up the platform from our existing robotic polishers, a larger robotic arm was used. The associated challenges include: timing considerations for both the polishing and metrology, obtaining sufficient material removal for reliable measurements, and difficulties modelling robot joint positions for collision prevention. These issues have been investigated and mitigated through proprietary techniques and novel solutions, some of which will be explored in this paper. One such technique currently under development at Optimax is deflectometry; which is a noninterferometric method involving fringe reflection and ray tracing to calculate the mid-spatial frequency (MSF) error on a part surface. Deflectometry is able to measure MSF error two orders of magnitude faster than the current method, and has been implemented in-situ, mitigating another challenges involved with larger freeform optics: the logistics of moving them around a shop floor safely.
Freeform optical shapes or optical surfaces that are designed with non-symmetric features are gaining popularity with lens designers and optical system integrators. Manufacturing and testing details will be discussed for freeforms as well as current manufacturing tolerancing limits. This paper will address challenges that have been encountered in the manufacturing, testing, and handling of freeforms as their size expands up to and beyond 500 mm, and provide future work that will address each challenge.
Recently the use of freeform surfaces have become a realization for optical designers. These non-symmetrical optical surfaces have allowed unique solutions to optical design problems. The implementation of freeform optical surfaces has been limited by manufacturing capabilities and quality. However over the past several years freeform fabrication processes have improved in capability and precision. But as with any manufacturing, proper metrology is required to monitor and verify the process. Typical optics metrology such as interferometry has its challenges and limitations with the unique shapes of freeform optics. Two contact metrology methods for freeform metrology are presented; a Leitz coordinate measurement machine (CMM) with an uncertainty of ± 0.5 μm and a high resolution profilometer (Panasonic UA3P) with a measurement uncertainty of ± 0.05 μm. We are also developing a non-contact high resolution technique based on the fringe reflection technique known as deflectometry. This fast non-contact metrology has the potential to compete with accuracies of the contact methods but also can acquire data in seconds rather than minutes or hours.
Freeform and conformal optics have the potential to dramatically improve optical systems by enabling systems with fewer optical components, reduced aberrations, and improved aerodynamic performance. These optical components differ from standard components in their surface shape, typically a non-symmetric equation based definition, and material properties. Traditional grinding and polishing tools are unable to handle these freeform shapes. Additionally, standard metrology tools cannot measure these surfaces. Desired substrates are typically hard ceramics, including poly-crystalline alumina or aluminum oxynitride. Notwithstanding the challenges that the hardness provides to manufacturing, these crystalline materials can be highly susceptible to grain decoration creating unacceptable scatter in optical systems. In this presentation, we will show progress towards addressing the unique challenges of manufacturing conformal windows and domes. Particular attention is given to our robotic polishing platform. This platform is based on an industrial robot adapted to accept a wide range of tooling and parts. The robot’s flexibility has provided us an opportunity to address the unique challenges of conformal windows. Slurries and polishing active layers can easily be changed to adapt to varying materials and address grain decoration. We have the flexibility to change tool size and shape to address the varying sizes and shapes of conformal optics. In addition, the robotic platform can be a base for a deflectometry-based metrology tool to measure surface form error. This system, whose precision is independent of the robot’s positioning accuracy, will allow us to measure optics in-situ saving time and reducing part risk. In conclusion, we will show examples of the conformal windows manufactured using our developed processes.
Freeform surfaces on optical components have become an important design tool for optical designers. Non-rotationally symmetric optical surfaces have made solving complex optical problems easier. The manufacturing and testing of these surfaces has been the technical hurdle in freeform optic’s wide-spread use. Computer Numerically Controlled (CNC) optics manufacturing technology has made the fabrication of optical components more deterministic and streamlined for traditional optics and aspheres. Optimax has developed a robust freeform optical fabrication CNC process that includes generation, high speed VIBE polishing, sub-aperture figure correction, surface smoothing and testing of freeform surfaces. Metrology of freeform surface is currently achieved with coordinate measurement machines (CMM) for lower resolution and interferometry with computer generated holograms (CGH) for high resolution irregularity measurements.
The evaluation of the measurement uncertainty of a robust all-fiber-based low-coherence interferometer for the measurement of absolute thickness of transparent artifacts is described. The performance of the instrument is evaluated by measuring the length of air-gaps in specially constructed artifacts and the observed measurement errors are discussed in the context of the uncertainty associated with them. A description of the construction of the artifacts is presented, accompanied by an uncertainty analysis to estimate the uncertainty associated with the artifacts. This analysis takes into account the dimensional uncertainty of the artifacts (including wringing effects), thermal effects, and effects of the environment on refractive index. The 'out-of-the-box' performance of the instrument is first evaluated. A maximum error of 350 nm for an air-gap of 10.1 mm is observed. A linear trend between the measured length and the error is also observed. The relative magnitude of the errors and the uncertainty associated with the error suggests that this trend is real and that a performance enhancement can be expected by mapping the error. Measurements of the artifacts are used to develop an error map of the instrument. The uncertainty associated with the predicted error is determined based on the uncertainty associated with the error. This analysis suggests that the uncertainty in the predicted error at the 2σ level may be conservatively estimated to be (2.9L+37.5) nm, where L is in units of mm.
Current inspection and QA technology is dominated in the packaging industry by on-line beta gauges, capacitance testing and infrared technology as well as off-line microscopy and basis weight processes. The optics industry uses standard interferometers, gauge block comparators and other contact technology. Current Dual light source interferometer technology, employed by Lumetrics, allows rapid off-line and on-line non-contact inspection of multi-layer plastics and coating applications, as well as optics and optical assemblies. Practical applications in numerous industries will be discussed. Results of online testing of a multi-layer label stock will also be presented.
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