Tom M. Godin
Precision Optics Manager at Satisloh North America Inc
SPIE Involvement:
Conference Program Committee | Symposium Committee | Author
Publications (3)

Proceedings Article | 15 October 2013
Proc. SPIE. 8884, Optifab 2013
KEYWORDS: Polishing, Metrology, Polishing equipment, Lenses, Manufacturing, Kinematics, Aspheric lenses, Lens grinding equipment, Surface finishing, Lens grinding

Proceedings Article | 15 October 2013
Proc. SPIE. 8884, Optifab 2013
KEYWORDS: Refractive index, Antireflective coatings, Visible radiation, Lenses, Sputter deposition, Glasses, Silicon, Coating, Reflectivity, Precision optics

Proceedings Article | 15 October 2013
Proc. SPIE. 8884, Optifab 2013
KEYWORDS: Thin films, Refractive index, Quantum wells, Argon, Sputter deposition, Ions, Silicon, Nitrogen, Coating, Oxygen

Conference Committee Involvement (9)
Optifab 2019
14 October 2019 | Rochester, New York, United States
Optifab 2017
16 October 2017 | Rochester, New York, United States
Optifab 2015
12 October 2015 | Rochester, New York, United States
Optifab 2013
14 October 2013 | Rochester, New York, United States
Optifab
9 May 2011 | Rochester, New York, United States
Showing 5 of 9 Conference Committees
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