Tom Kavli
Chief Scientist at SINTEF
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 29, 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Reflectors, Point spread functions, Modulation, Scattering, Cameras, Image processing, Light scattering, Distance measurement, Phase measurement, Phase shifts

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