Tom B. Vo
Opto-Mechanical Engineer at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 7, 2006
Proc. SPIE. 6295, Infrared Detectors and Focal Plane Arrays VIII
KEYWORDS: Mid-IR, Data modeling, Interferometers, Calibration, Spectroscopy, Error analysis, Crystals, Fourier transforms, Wave plates, Systems modeling

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