Dr. Tomas Lindstrom
at Amic AB
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | January 17, 2003
Proc. SPIE. 4984, Micromachining Technology for Micro-Optics and Nano-Optics
KEYWORDS: Reflectors, Monochromatic aberrations, Mirrors, Retroreflectors, Reflection, Polymers, Silicon, Photoresist materials, Spherical lenses, Optics manufacturing

SPIE Journal Paper | February 1, 2000
OE Vol. 39 Issue 02
KEYWORDS: Scattering, Light scattering, Reflectivity, Transmittance, Interfaces, Profilometers, Integrating spheres, Scatter measurement, Reflection, Surface roughness

PROCEEDINGS ARTICLE | October 5, 1999
Proc. SPIE. 3779, Current Developments in Optical Design and Optical Engineering VIII
KEYWORDS: Semiconductors, Thin films, Refractive index, Mirrors, Reflection, Copper, Silver, Reflectivity, Transmittance, Digital video discs

PROCEEDINGS ARTICLE | September 6, 1999
Proc. SPIE. 3739, Optical Fabrication and Testing
KEYWORDS: Optical components, Optical spheres, Scattering, Laser applications, Laser development, Inspection, Laser scattering, Scatter measurement, Standards development, Laser systems engineering

PROCEEDINGS ARTICLE | September 26, 1997
Proc. SPIE. 3141, Scattering and Surface Roughness
KEYWORDS: Oxides, Thin films, Diffuse reflectance spectroscopy, Interfaces, Light scattering, Reflectivity, Surface roughness, Atomic force microscopy, Transmittance, Tin

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top