Dr. Tomas Stankevic
PhD student at Max IV Lab
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 7 September 2017 Presentation + Paper
Ulrich Vogt, Karolis Parfeniukas, Tomaš Stankevič, Sebastian Kalbfleisch, Marianne Liebi, Zdenek Matej, Alexander Björling, Gerardina Carbone, Anders Mikkelsen, Ulf Johansson
Proceedings Volume 10389, 103890K (2017) https://doi.org/10.1117/12.2272960
KEYWORDS: X-ray microscopy, X-rays, Nanoimaging, X-ray optics, Nanoprobes, Zone plates, Hard x-rays, Synchrotron radiation, Scanners, X-ray fluorescence spectroscopy

Proceedings Article | 18 September 2015 Paper
Dmitry Dzhigaev, Tomaš Stankevič, Ilya Besedin, Sergey Lazarev, Anatoly Shabalin, Mikhail Strikhanov, Robert Feidenhans'l, Ivan Vartanyants
Proceedings Volume 9592, 95920S (2015) https://doi.org/10.1117/12.2190416
KEYWORDS: Indium, X-rays, Scattering, Sensors, Finite element methods, Optical spheres, Crystals, X-ray diffraction, Diffraction, Nanowires

Proceedings Article | 18 September 2015 Paper
Tomaš Stankevič, Dmitry Dzhigaev, Zhaoxia Bi, Max Rose, Anatoly Shabalin, Juliane Reinhardt, Anders Mikkelsen, Lars Samuelson, Gerald Falkenberg, Ivan Vartanyants, Robert Feidenhans'l
Proceedings Volume 9592, 95920D (2015) https://doi.org/10.1117/12.2190693
KEYWORDS: X-rays, Gallium nitride, Sensors, Indium gallium nitride, X-ray microscopy, Scanning electron microscopy, Heterojunctions, Electroluminescent displays, Crystals, Nanowires

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