Dr. Tomas Stankevic
PhD student at Max IV Lab
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: X-ray microscopy, X-rays, Nanoimaging, X-ray optics, Nanoprobes, Zone plates, Hard x-rays, Synchrotron radiation, Scanners, X-ray fluorescence spectroscopy

PROCEEDINGS ARTICLE | September 18, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: X-rays, Gallium nitride, Sensors, Indium gallium nitride, X-ray microscopy, Scanning electron microscopy, Heterojunctions, Electroluminescent displays, Crystals, Nanowires

PROCEEDINGS ARTICLE | September 18, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Indium, X-rays, Scattering, Sensors, Finite element methods, Optical spheres, Crystals, X-ray diffraction, Diffraction, Nanowires

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