Dr. Tomasz Kolodziej
at Argonne National Lab
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Metrology, X-rays, Wavefront sensors, Interferometry, Wavefronts, X-ray imaging, Interferometers, Near field, Speckle, Phase contrast

PROCEEDINGS ARTICLE | September 15, 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: X-rays, Spectrographs, Free electron lasers, Diagnostics, Diamond, Crystals, Dispersion, Laser crystals, Sensors, Monochromators

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