Dr. Tomasz Kolodziej
at Argonne National Lab/ Advanced Photon Source
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Metrology, Phase contrast, Speckle, Interferometers, X-rays, Interferometry, Wavefront sensors, Wavefronts, Near field, X-ray imaging

PROCEEDINGS ARTICLE | September 15, 2016
Proc. SPIE. 9963, Advances in X-Ray/EUV Optics and Components XI
KEYWORDS: Spectrographs, Diamond, Sensors, Dispersion, Crystals, X-rays, Diagnostics, Laser crystals, Monochromators, Free electron lasers

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