Prof. Tomasz Kozacki
at Warsaw Univ. of Technology
SPIE Involvement:
Conference Chair | Editor | Author
Publications (51)

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11353, Optics, Photonics and Digital Technologies for Imaging Applications VI
KEYWORDS: Holograms, Holography, Digital holography, Spatial frequencies, Fourier transforms, Wavefronts, Wave propagation, Paraxial approximations, Spherical lenses

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11353, Optics, Photonics and Digital Technologies for Imaging Applications VI
KEYWORDS: Holograms, Holography, 3D image reconstruction, Imaging systems, Spatial light modulators, Wave propagation, Digital micromirror devices, Fourier optics, Color imaging, RGB color model

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Refractive index, Holography, Photonic crystal fibers, Computer simulations, Tomography, Multiple scattering, Wave propagation, Reconstruction algorithms

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Beam splitters, Light sources, Holograms, Holography, Digital holography, Imaging systems, Microscopy, Spatial light modulators, Spatial coherence, Holographic interferometry

Proceedings Article | 4 March 2019 Paper
Proc. SPIE. 10887, Quantitative Phase Imaging V
KEYWORDS: Holograms, Interferometers, Interferometry, Wavefronts, Holographic interferometry, Visibility

Showing 5 of 51 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (6)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optics, Photonics and Digital Technologies for Imaging Applications VI
6 April 2020 | Online Only, France
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optics, Photonics and Digital Technologies for Imaging Applications
24 April 2018 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Showing 5 of 6 Conference Committees
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