Prof. Tomasz Kozacki
Student at Warsaw Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (46)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Holograms, Holography, Light emitting diodes, 3D image reconstruction, Digital holography, Multiplexing, Spatial light modulators, LED displays, RGB color model

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Speckle, Multiplexing, Digital micromirror devices, LED displays, Binary data

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Diffraction, Holograms, Phase modulation, Computer simulations, Spatial light modulators, Liquid crystal on silicon

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Holograms, Holography, Digital holography, Interferometry, Computer simulations, Microlens, Reconstruction algorithms, Phase measurement, Holographic interferometry, Algorithm development

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Refractive index, Holograms, Holography, Tomography, 3D metrology, Alignment procedures

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Signal to noise ratio, Holograms, Holography, Optical spheres, Digital holography, Denoising, Microscopy, Reconstruction algorithms, Spherical lenses, 3D image processing

Showing 5 of 46 publications
Conference Committee Involvement (4)
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optics, Photonics and Digital Technologies for Imaging Applications
24 April 2018 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
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