Dr. Tomasz J. Ochalski
Senior Research Fellow at Cork Institute of Technology
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 12 September 2019
Proc. SPIE. 11081, Active Photonic Platforms XI
KEYWORDS: Nanostructures, Refractive index, Indium gallium arsenide, Luminescence, Interfaces, Silicon, Optoelectronics, Carrier dynamics, Group III-V semiconductors, Temperature metrology

Proceedings Article | 8 March 2019
Proc. SPIE. 10927, Photonic and Phononic Properties of Engineered Nanostructures IX
KEYWORDS: Carbon, Diamond, Biosensing, Scattering, Luminescence, Crystals, Chemistry, Raman spectroscopy, Phonons, Raman scattering

Proceedings Article | 14 March 2018
Proc. SPIE. 10543, Quantum Dots and Nanostructures: Growth, Characterization, and Modeling XV
KEYWORDS: Nanostructures, Indium gallium arsenide, Luminescence, Interfaces, Silicon, Optoelectronics, Carrier dynamics, Singular optics, Modes of laser operation, Group III-V semiconductors

Proceedings Article | 14 March 2018
Proc. SPIE. 10537, Silicon Photonics XIII
KEYWORDS: Refractive index, Light sources, Luminescence, Gallium arsenide, Silicon, Semiconductor lasers, Optoelectronics, Picosecond phenomena, Group III-V semiconductors, Nanowires

Proceedings Article | 20 February 2017
Proc. SPIE. 10113, High Contrast Metastructures VI
KEYWORDS: Mid-IR, Optical components, Reflectors, Lithography, Electron beam lithography, Optical filters, Refractive index, Mirrors, Optical design, Biosensing, Optical lithography, Etching, Germanium, Silicon, Reflectivity, Polarizers, Photoresist materials, Telecommunications, Biological research

Showing 5 of 15 publications
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