Dr. Tomi Jouhti
Co-Founder at Brighterwave Inc
SPIE Involvement:
Author
Publications (13)

PROCEEDINGS ARTICLE | May 5, 2010
Proc. SPIE. 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications
KEYWORDS: Light sources, Waveguides, Speckle, Laser applications, Semiconductor lasers, Diodes, Infrared radiation, Frequency conversion, Nonlinear crystals, Visibility

PROCEEDINGS ARTICLE | February 17, 2010
Proc. SPIE. 7578, Solid State Lasers XIX: Technology and Devices
KEYWORDS: Light sources, Continuous wave operation, Waveguides, Fiber Bragg gratings, Speckle, Semiconductor lasers, Infrared lasers, Laser stabilization, Nonlinear crystals, Visibility

PROCEEDINGS ARTICLE | April 14, 2006
Proc. SPIE. 6184, Semiconductor Lasers and Laser Dynamics II
KEYWORDS: Optical design, Quantum wells, Modulation, Waveguides, Metals, Laser processing, Semiconductor lasers, Ion beams, Waveguide lasers, Temperature metrology

PROCEEDINGS ARTICLE | April 14, 2006
Proc. SPIE. 6184, Semiconductor Lasers and Laser Dynamics II
KEYWORDS: Indium gallium arsenide, Quantum wells, Optical properties, Chemical species, Annealing, Luminescence, Gallium arsenide, Nitrogen, Beryllium, Gallium

PROCEEDINGS ARTICLE | December 6, 2005
Proc. SPIE. 6020, Optoelectronic Materials and Devices for Optical Communications
KEYWORDS: Quantum wells, Chemical species, Annealing, Luminescence, Gallium arsenide, Nitrogen, Laser processing, Doping, Beryllium, Arsenic

PROCEEDINGS ARTICLE | July 7, 2005
Proc. SPIE. 5840, Photonic Materials, Devices, and Applications
KEYWORDS: Refractive index, Eye, Fabry–Perot interferometers, Quantum wells, Modulation, Gallium arsenide, Nitrogen, Semiconductor lasers, Laser damage threshold, Temperature metrology

Showing 5 of 13 publications
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