Dr. Tomohiro Hirose
at
SPIE Involvement:
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Publications (1)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Mirrors, Reflection, Imaging systems, Cameras, Calibration, CCD cameras, Deflectometry, Stereoscopic cameras, 3D profilers, Light

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