Tomoyuki Takeguchi
Depth Aspect Images at Hokkaido Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 30, 2003
Proc. SPIE. 5264, Optomechatronic Systems IV
KEYWORDS: Statistical analysis, Detection and tracking algorithms, Data modeling, Databases, Feature extraction, Monte Carlo methods, Object recognition, Statistical modeling, Model-based design, Process modeling

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