Micro-focusing protein crystallography beamline BL45XU was remodeled using focusing mirrors and a slit as a secondary source. In the horizontal direction, two stage focusing was adopted and beam size was controlled by the slit and defocusing of 2nd mirror by changing the glancing angle. In the vertical direction, beam size was enlarged by defocusing by changing the glancing angle. Beam profile and photon flux through slit and mirror were estimated using a wave calculation, and compared with the measurements. We verified that beam size can be controlled using a slit and mirror defocusing from 5×5 to 50×50 μm2, and measured photon flux agreed with estimation.
We measured the thermal-contact-conductance (TCC) of indirect cooling components in synchrotron radiation
beamlines. To reduce the strain on the optical element, we explored conditions for insertion materials with a high TCC in
region with low contact pressures of 0.1-1.0 MPa. We examined the TCC at the interface between oxygen-free copper
(OFC) and insertion materials such as indium, graphite, and gold foil. The TCC depended on the hardness and thickness
of the insertion material. Thin indium (20 μm thick) showed the highest TCC. Nickel and gold passivation on the OFC
surface reduced the TCC to 30% of that for the bare OFC. Future work will involve exploring the passivation conditions
of OFC for higher TCC is and measuring the TCC under cryogenic-cooling conditions.
Thermal contact in water-cooling or cryogenic cooling-cooling condition is used for forming a high-heat-load component
at the synchrotron radiation beamline. In SPring-8, for example, cryogenic cooling is used for silicon monochromator
crystal with an indium insertion metal at the interface between a copper block and a silicon crystal. To reduce the strain
on the silicon crystal with a low contact pressure and a high thermal conductivity, we require a silicon-indium-copper
system and an alternative insertion material such as a graphite foil. To measure the thermal contact conductance in a
quick measurement cycle under various thermal-contact conditions, we improve the thermal-contact-conductance
measurement system in terms of the setup facilitation, precise temperature measurement, and thermal insulation around a
BL37XU (trace element analysis beamline) and BL39XU (magnetic materials beamline) at SPring-8 have been upgraded
to provide nano-probe analysis. We designed and installed Kirkpatrick-Baez (KB) mirrors and corresponding
manipulators, which have an X-ray focusing beam as small as 100 nm. To realize a high-flux 100-nm focusing beam, a
high-demagnification optical design was used, and new experimental hutches were constructed that are located about 80
m from the light source. By taking advantage of extended beamline, focusing photon flux density of over 1 x 109(photons/sec/100x100nm2) is possible with a working distance of 100 mm at X-ray energy of around 10 keV. The
current status of these beamlines is reported.
A high-precision slit for monochromatic x-rays has been developed as one of the standardized components in the
undulator beamline at SPring-8. Advanced experiments such as x-ray micro-beam diffraction and x-ray scanning
microscope using nano-beam require small, variable and accurate apertures. The newly developed slit has an aperture
size ranging from 1 μm × 1 μm to 20 mm × 20 mm with a resolution of 0.5 μm in full step. Each blade is independently
driven through bellows mounted on both sides of the vacuum chamber. A set of bellows prevents displacement of the
blade by evacuation. Using this slit, we could improve the displacement from 20 μm to 1 μm. The positioning accuracy
of the slit is 0.5 μm. The slits have been installed in the three beamlines at SPring-8.