Dr. Tony L. Schmitz Profile

Dr. Tony L. Schmitz

at Univ of Florida

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 17 September 2007 Paper

A survey of technical literature on adhesive applications for optics

Krithika Prabhu, Tony Schmitz, Peter Ifju, John Daly

Proceedings Volume 6665, 666507 (2007) https://doi.org/10.1117/12.735948

KEYWORDS: Adhesives, Ultraviolet radiation, Epoxies, Interfaces, Temperature metrology, Adaptive optics, Optical fabrication, Glasses, Refractive index, Optical components

Read Abstract +

Proceedings Article | 18 August 2005 Paper

Radius case study: optical bench measurement and uncertainty including stage error motions

Tony Schmitz, Neil Gardner, Matthew Vaughn, Angela Davies

Proceedings Volume 5879, 58790B (2005) https://doi.org/10.1117/12.614988

KEYWORDS: Confocal microscopy, Eye, Motion measurement, Optical benches, Interferometers, Monte Carlo methods, Optical spheres, Optical testing, Spherical lenses, Computer programming

Read Abstract +

Proceedings Article | 20 November 2003 Paper

Defining the measurand in radius of curvature measurements

Angela Davies, Tony Schmitz

Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.504884

KEYWORDS: Confocal microscopy, Eye, Error analysis, Motion measurement, Interferometers, Optical spheres, Optical benches, Optical testing, Calibration, Optics manufacturing

Read Abstract +

SPIE Journal Paper | 1 August 2003

Silicon wafer thickness variation measurements using the National Institute of Standards and Technology infrared interferometer

Tony Schmitz, Angela Davies, Chris Evans, Robert Parks

OE, Vol. 42, Issue 08, (August 2003) https://doi.org/10.1117/12.10.1117/1.1589757

KEYWORDS: Semiconducting wafers, Silicon, Interferometers, Collimators, Reflection, Wavefronts, Infrared technology, Collimation, Optical engineering, Standards development

Proceedings Article | 4 November 2002 Paper

High-speed noninterferometric nanotopographic characterization of Si wafer surfaces

Thomas Raymond, Daniel Neal, Daniel Topa, Tony Schmitz

Proceedings Volume 4809, (2002) https://doi.org/10.1117/12.450990

KEYWORDS: Semiconducting wafers, Silicon, Polishing, Sensors, Wafer-level optics, Surface finishing, Wavefronts, Interferometers, Interferometry, Manufacturing

Read Abstract +

Proceedings Article | 27 December 2001 Paper

Uncertainties in interferometric measurements of radius of curvature

Tony Schmitz, Angela Davies, Christopher Evans

Proceedings Volume 4451, (2001) https://doi.org/10.1117/12.453641

KEYWORDS: Optical spheres, Confocal microscopy, Eye, Wavefronts, Interferometers, Environmental sensing, Zerodur, Spherical lenses, Interferometry, Uncertainty analysis

Read Abstract +

Proceedings Article | 22 August 2001 Paper

Interferometric testing of photomask substrate flatness

Christopher Evans, Robert Parks, Lianzhen Shao, Tony Schmitz, Angela Davies

Proceedings Volume 4344, (2001) https://doi.org/10.1117/12.436725

KEYWORDS: Photomasks, Optical spheres, Interferometers, Reflection, Interferometry, Reflectivity, Wavefronts, Visibility, Spherical lenses, Extreme ultraviolet lithography

Read Abstract +

Proceedings Article | 18 June 2001 Paper

Interferometric figure metrology: enabling in-house traceability

Christopher Evans, Angela Davies, Tony Schmitz, Robert Parks

Proceedings Volume 4450, (2001) https://doi.org/10.1117/12.431256

KEYWORDS: Optical testing, Wavefronts, Interferometers, Metrology, Calibration, Optics manufacturing, Semiconducting wafers, Uncertainty analysis, Interferometry, Signal to noise ratio

Read Abstract +

Showing 5 of 8 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years