Torsten Krug
PhD Student at Instrument Systems Optische Messtechnik GmbH
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 May 2011
Proc. SPIE. 8083, Modeling Aspects in Optical Metrology III
KEYWORDS: Diffraction, Light emitting diodes, Scattering, Spectroscopy, Light scattering, Computer simulations, Monte Carlo methods, Ray tracing, Stray light, Diffraction gratings

Proceedings Article | 3 June 2005
Proc. SPIE. 5825, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks
KEYWORDS: Semiconductors, Photodetectors, Photons, Wavelength division multiplexing, Multiplexing, Nonlinear optics, Crystal optics, Optical microcavities, Channel projecting optics, Absorption

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