Dr. Toru Wakahara
at Hosei Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 March 2019
Proc. SPIE. 11049, International Workshop on Advanced Image Technology (IWAIT) 2019
KEYWORDS: Pattern recognition, Distortion, Image registration, Computer vision technology, Machine vision, Adaptive control

Proceedings Article | 1 April 1998
Proc. SPIE. 3305, Document Recognition V
KEYWORDS: Lithium, Principal component analysis, Detection and tracking algorithms, Databases, Distortion, Feature extraction, Distance measurement, Associative arrays, Optical character recognition

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