Prof. Toru Yoshizawa
at Tokyo Univ of Agriculture and Technology
SPIE Involvement:
Fellow status | Conference Chair | Conference Program Committee | Conference Co-Chair | Symposium Committee | Symposium Chair | Editor | Author
Publications (118)

SPIE Conference Volume | January 19, 2017

SPIE Conference Volume | December 10, 2014

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Mirrors, Fringe analysis, Oncology, Cancer, Cameras, Semiconductor lasers, Radiotherapy, Stereoscopic cameras, 3D metrology, Projection systems

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Ellipsometry, Mirrors, Spindles, Inspection, Receivers, Semiconductor lasers, CCD cameras, Beam shaping, Optical alignment, Optics manufacturing

Showing 5 of 118 publications
Conference Committee Involvement (36)
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Showing 5 of 36 published special sections
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