Prof. Toru Yoshizawa Profile

Prof. Toru Yoshizawa

at Tokyo Univ of Agriculture and Technology

SPIE Involvement:

Publications (118)

SPIE Conference Volume | January 19, 2017

Optical Metrology and Inspection for Industrial Applications IV

SPIE Conference Volume | June 5, 2015

Dimensional Optical Metrology and Inspection for Practical Applications IV

SPIE Conference Volume | December 10, 2014

Optical Metrology and Inspection for Industrial Applications III

PROCEEDINGS ARTICLE | November 13, 2014

Compact camera for 3D position registration of cancer in radiation treatment

Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III

KEYWORDS: Mirrors, Fringe analysis, Oncology, Cancer, Cameras, Semiconductor lasers, Radiotherapy, Stereoscopic cameras, 3D metrology, Projection systems

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SPIE Conference Volume | June 12, 2014

Dimensional Optical Metrology and Inspection for Practical Applications III

PROCEEDINGS ARTICLE | May 28, 2014

Optical center alignment technique based on inner profile measurement method

Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III

KEYWORDS: Ellipsometry, Mirrors, Spindles, Inspection, Receivers, Semiconductor lasers, CCD cameras, Beam shaping, Optical alignment, Optics manufacturing

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SPIE Journal Paper | April 9, 2014

High-speed three-dimensional shape measurements using multiwavelength spatiotemporal phase shifting

Wakayama, Toshitaka , Yoshizawa, Toru

OE Vol. 53 Issue 11

KEYWORDS: 3D metrology, Phase shifts, Fringe analysis, Phase shifting, Projection systems, Semiconductor lasers, Digital Light Processing, Cameras, Mirrors, RGB color model

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SPIE Conference Volume | October 10, 2013

Dimensional Optical Metrology and Inspection for Practical Applications II

PROCEEDINGS ARTICLE | September 27, 2013

Evaluation of Mueller matrix of achromatic axially symmetric wave plate

Proc. SPIE. 8873, Polarization Science and Remote Sensing VI

KEYWORDS: Optical components, Polishing, Biomedical optics, Silica, Polarization, Reflection, Dispersion, Polarizers, Wave plates, Polarimetry

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PROCEEDINGS ARTICLE | September 6, 2013

Uni-axial inner profile measurement

Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II

KEYWORDS: Optical fibers, Mirrors, Beam splitters, Light sources, Polarizers, Semiconductor lasers, CCD cameras, 3D metrology, Charge-coupled devices, Beam shaping

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PROCEEDINGS ARTICLE | June 25, 2013

State of the art of compact optical 3D profile measurement apparatuses: from outer surface to inner surface measurement

Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)

KEYWORDS: Microelectromechanical systems, Optical fibers, Mirrors, Cameras, Optical testing, Semiconductor lasers, CCD cameras, Collimation, 3D metrology, Projection systems

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SPIE Conference Volume | January 2, 2013

Optical Metrology and Inspection for Industrial Applications II

PROCEEDINGS ARTICLE | November 20, 2012

Small size probe for inner profile measurement of pipes using optical fiber ring beam device

Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II

KEYWORDS: Optical fibers, Mirrors, Cameras, Ions, Inspection, Optical testing, Collimators, 3D metrology, Charge-coupled devices, Indium nitride

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PROCEEDINGS ARTICLE | September 13, 2012

An interferometric observation of topological effect by novel axially symmetrical wave plate

Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis

KEYWORDS: Optical components, Polymethylmethacrylate, Silica, Polarization, Manufacturing, Interferometry, Polarizers, Wave plates, Optical vortices, Spiral phase plates

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SPIE Journal Paper | January 31, 2012

Compact camera for three-dimensional profilometry incorporating a single MEMS mirror

Wakayama, Toshitaka , Yoshizawa, Toru

OE Vol. 51 Issue 1

KEYWORDS: Mirrors, Microelectromechanical systems, Cameras, Stereoscopic cameras, Semiconductor lasers, Projection systems, LCDs, 3D metrology, CCD cameras, Calibration

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SPIE Conference Volume | November 22, 2011

2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology

PROCEEDINGS ARTICLE | September 14, 2011

Development of a probe for inner profile measurement and flaw detection

Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications

KEYWORDS: Optical components, Mirrors, Prisms, Cameras, Glasses, Inspection, Optical testing, Semiconductor lasers, CCD cameras, Defect inspection

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PROCEEDINGS ARTICLE | September 10, 2011

Color pattern projection method for three-dimensional measurement

Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications

KEYWORDS: Microelectromechanical systems, Mirrors, Cameras, Semiconductor lasers, Time metrology, Image sensors, Stereoscopic cameras, 3D metrology, Projection systems, Digital micromirror devices

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SPIE Conference Volume | August 29, 2011

Dimensional Optical Metrology and Inspection for Practical Applications

PROCEEDINGS ARTICLE | November 11, 2010

Development of an inner profile measurement instrument using a ring beam device

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Optical components, Mirrors, Medicine, Cameras, Glasses, Inspection, Semiconductor lasers, CCD cameras, CMOS cameras, Dentistry

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Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and other industrial applications. Here we describe recent development of our measurement principle for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without using any contact type stylus. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In our hitherto trial experimental works, the availability of this instrument has been evaluated in many cases and availability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disk-like light sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument at this point. Both the ring beam device and a miniaturized CCD camera are fabricated into a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose potentially possible method for measurement of external profile at the same time with internal profile. If one pair of concave mirrors are used in our arrangement, external profile is captured. In combination with inner profile measurement technique, simultaneous measurement of inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of here proposed principle. In addition, we are trying to extend our technique to check defects and/or flaws on the inner wall of pipe-like objects.

PROCEEDINGS ARTICLE | November 11, 2010

A palm-top camera for 3D profilometry incorporating a MEMS scanner

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Microelectromechanical systems, Mirrors, Cameras, Scanners, Semiconductor lasers, Laser scanners, Image sensors, Stereoscopic cameras, 3D metrology, 3D scanning

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PROCEEDINGS ARTICLE | November 11, 2010

Spectroscopic topological Stokes polarimeter

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Light sources, Polarization, Birefringence, Spectroscopy, Polarizers, Wave plates, Polarimetry, Charge-coupled devices, Optical alignment, Spiral phase plates

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SPIE Conference Volume | November 4, 2010

Optical Metrology and Inspection for Industrial Applications

SPIE Conference Volume | November 3, 2010

Optoelectronic Imaging and Multimedia Technology

PROCEEDINGS ARTICLE | August 3, 2010

Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shifter

Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis

KEYWORDS: Microscopes, Phase shifting, Calibration, Lens design, CCD cameras, Distance measurement, 3D metrology, Liquid crystals, Bessel functions, Phase shifts

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PROCEEDINGS ARTICLE | November 24, 2009

Compact camera system for 3D profile measurement

Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology

KEYWORDS: Microelectromechanical systems, Mirrors, Imaging systems, Cameras, Scanners, Stereoscopic cameras, 3D metrology, Projection systems, Liquid crystals, Phase shifts

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PROCEEDINGS ARTICLE | November 24, 2009

Measurement of inner and/or outer profiles of pipes using ring beam devices

Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology

KEYWORDS: Optical components, Refractive index, Mirrors, Medicine, Cameras, Glasses, Inspection, Semiconductor lasers, CMOS cameras, Dentistry

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Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and industry. Here we propose a measurement method for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without any contact probe. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In the hitherto-tried experimental works, the availability of this instrument has been highly evaluated and usability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disklike light beam sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument. Both the ring beam device and a miniaturized CCD camera are fabricated in a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose an improved method for measuring the external profile in addition to the internal profile. In our arrangement, one pair of concaved conical mirrors is used for the external profile measurement. In combination with the inner profile measurement technique, simultaneous measurement of the inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of newly proposed principle. Now we are aiming to realize simultaneous measurement of the internal and external profiles of various types of pipes and similar objects.

SPIE Conference Volume | November 23, 2009

2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology

PROCEEDINGS ARTICLE | September 10, 2009

Three-dimensional profilometry system incorporating a MEMS scanner

Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries

KEYWORDS: Microelectromechanical systems, Mirrors, Imaging systems, Cameras, Scanners, Laser scanners, Stereoscopic cameras, 3D metrology, Projection systems, 3D scanning

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PROCEEDINGS ARTICLE | September 10, 2009

Three-dimensional profilometry based on focus method by projecting LC grating pattern

Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries

KEYWORDS: Microscopes, Phase shifting, Distance measurement, 3D metrology, Liquid crystals, Liquid lenses, Bessel functions, Optics manufacturing, Liquids, Phase shifts

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SPIE Conference Volume | September 10, 2009

Optical Inspection and Metrology for Non-Optics Industries

PROCEEDINGS ARTICLE | August 12, 2009

Axisymmetrical Mueller matrix polarimeter

Proc. SPIE. 7461, Polarization Science and Remote Sensing IV

KEYWORDS: Mirrors, Axicons, Modulation, Polarization, Sensors, Polarizers, Wave plates, Polarimetry, CCD cameras, CCD image sensors

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PROCEEDINGS ARTICLE | November 17, 2008

Generation of vortex spectra based on geometric phase for optical tweezers

Proc. SPIE. 7266, Optomechatronic Technologies 2008

KEYWORDS: Light sources, Polarization, Particles, Polarizers, Wave plates, Spatial light modulators, Optical tweezers, Geometrical optics, Spiral phase plates, Dielectric polarization

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PROCEEDINGS ARTICLE | August 29, 2008

Simultaneous measurement of internal and external profiles using a ring beam device

Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI

KEYWORDS: Mirrors, Cameras, Glasses, Inspection, Optical testing, Semiconductor lasers, CCD cameras, Precision measurement, 3D metrology, Beam shaping

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SPIE Conference Volume | August 28, 2008

Two- and Three-Dimensional Methods for Inspection and Metrology VI

PROCEEDINGS ARTICLE | August 11, 2008

Moiré topography using a liquid-crystal-grating based frequency modulation technique

Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis

KEYWORDS: Light sources, Moire patterns, Modulation, Lenses, CCD cameras, Frequency modulation, 3D metrology, Liquid crystals, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | October 10, 2007

Applications of a MEMS scanner to profile measurement

Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V

KEYWORDS: Microelectromechanical systems, Mirrors, Fringe analysis, Scanners, Manufacturing, Laser scanners, 3D metrology, 3D scanning, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | October 10, 2007

Development of a compact inner profile measuring instrument

Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V

KEYWORDS: Optical components, Refractive index, Mirrors, CMOS sensors, Cameras, Calibration, Glasses, Error analysis, Inspection, Semiconductor lasers

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PROCEEDINGS ARTICLE | October 19, 2006

Light-driven micromanipulator and its application for 3D fabrications

Proc. SPIE. 6374, Optomechatronic Actuators, Manipulation, and Systems Control

KEYWORDS: Actuators, Optical fibers, 3D applications, Glasses, Particles, Magnetism, 3D metrology, Finite element methods, Photothermal effect, Optical actuators

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PROCEEDINGS ARTICLE | October 12, 2006

Inner profile measurement of pipes and holes using a ring beam device

Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV

KEYWORDS: Mirrors, Prisms, Polishing, Optical fabrication equipment, Cameras, Inspection, Optical testing, CCD cameras, Charge-coupled devices, Liquids

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SPIE Conference Volume | October 12, 2006

Optomechatronic Actuators, Manipulation, and Systems Control

PROCEEDINGS ARTICLE | October 12, 2006

White light displacement sensor by spectro-polarization modulator

Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV

KEYWORDS: Chromatic aberrations, Light sources, Optical sensors, Polarization, Sensors, Spectroscopy, Polarizers, Wave plates, Modulators, Spectroscopes

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PROCEEDINGS ARTICLE | March 7, 2006

Three-dimensional profilometry using moire pattern projection

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Moire patterns, Fringe analysis, Electronics, Phase shifting, 3D metrology, Liquid crystals, Phase measurement, Binary data, Prototyping, Phase shifts

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SPIE Journal Paper | March 1, 2006

Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light

Wakayama, Toshitaka , Kowa, Hiroyuki , Otani, Yukitoshi , Umeda, Norihiro , Yoshizawa, Toru

OE Vol. 45 Issue 03

KEYWORDS: Birefringence, Spectroscopy, Polarizers, Quartz, Modulation, Optical engineering, Wave plates, CCD cameras, Acousto-optics, Tunable filters

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SPIE Conference Volume | December 5, 2005

Optomechatronic Actuators and Manipulation

PROCEEDINGS ARTICLE | November 7, 2005

Three-dimensional shape measurement using focus method by liquid crystal grating and liquid varifocus lens

Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III

KEYWORDS: Mirrors, Phase shifting, Sensors, Inspection, Distance measurement, 3D metrology, Liquid crystals, Liquid lenses, Liquids, Phase shifts

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PROCEEDINGS ARTICLE | November 7, 2005

Surface profile measurement by grating projection method with dual-projection optics

Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III

KEYWORDS: Software, Cameras, Calibration, Image processing, Reflectivity, Time metrology, Projection systems, Liquid crystals, Phase measurement, 3D image processing

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PROCEEDINGS ARTICLE | November 7, 2005

Liquid crystal grating for profilmetry using structured light

Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III

KEYWORDS: Phase shifting, Modulation, Glasses, Time metrology, 3D metrology, Projection systems, Liquid crystals, Transmittance, Binary data, Structured light

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PROCEEDINGS ARTICLE | August 19, 2005

Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern

Proc. SPIE. 5880, Optical Diagnostics

KEYWORDS: Fringe analysis, Teeth, Image processing, Skin, Medical research, Mouth, Life sciences, CCD cameras, Speckle pattern, Mechanical engineering

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SPIE Journal Paper | January 1, 2005

Optimizing design of high-resolution optical encoder using a point-source light-emitting diode with slits

Matsuzoe, Yuji , Koizumi, Kazuhiro , Saitoh, Tetsuya , Yoshizawa, Toru

OE Vol. 44 Issue 01

KEYWORDS: Computer programming, Light emitting diodes, Diffraction gratings, Light sources, Photodetectors, Optical design, Optical encoders, Light, Temperature metrology, Diffraction

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SPIE Conference Volume | October 25, 2004

Optomechatronic Sensors, Actuators, and Control

PROCEEDINGS ARTICLE | October 25, 2004

Two-dimensional actuator using temperature-sensitive ferrite driven by light beam

Proc. SPIE. 5602, Optomechatronic Sensors, Actuators, and Control

KEYWORDS: Actuators, Opto mechatronics, Magnetism, Semiconductor lasers, Light sources and illumination, Optical simulations, Photothermal effect, Laser optics, Optical actuators, Temperature metrology

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SPIE Conference Volume | October 25, 2004

Optomechatronic Micro/Nano Components, Devices, and Systems

PROCEEDINGS ARTICLE | October 23, 2003

Three-dimensional imaging using liquid crystal grating projection

Proc. SPIE. 5202, Optical Information Systems

KEYWORDS: Eye, Phase shifting, Modulation, CCD cameras, 3D metrology, Projection systems, Liquid crystals, Transmittance, Binary data, 3D image processing

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SPIE Conference Volume | September 30, 2003

Optomechatronic Systems IV

PROCEEDINGS ARTICLE | September 30, 2003

Micromanipulator by photothermal effect

Proc. SPIE. 5264, Optomechatronic Systems IV

KEYWORDS: Actuators, Optical fibers, Opto mechatronics, Quartz, Glasses, Photography, Magnetism, Microlens, Photothermal effect, Optical actuators

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SPIE Journal Paper | July 1, 2003

Research on solidification of resin in stereolithography

Nagamori, Shigeru , Yoshizawa, Toru

OE Vol. 42 Issue 07

KEYWORDS: Solids, Manufacturing, Stereolithography, Signal attenuation, 3D modeling, Laser scanners, Data modeling, Glasses, Optical engineering, Laser irradiation

PROCEEDINGS ARTICLE | April 29, 2003

Three-dimensional profilometry using liquid crystal grating

Proc. SPIE. 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002

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PROCEEDINGS ARTICLE | April 29, 2003

Research on shape of solidified resin in stereo-lithography

Proc. SPIE. 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002

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SPIE Journal Paper | January 1, 2003

High-performance absolute rotary encoder using multitrack and M-code

Matsuzoe, Yuji , Tsuji, Nobuhiko , Nakayama, Tomoharu , Fujita, Koetsu , Yoshizawa, Toru

OE Vol. 42 Issue 01

KEYWORDS: Computer programming, Photodetectors, Signal detection, Distortion, Optical encoders, Binary data, Light emitting diodes, Optical engineering, Transistors, Sensors

PROCEEDINGS ARTICLE | October 18, 2002

Birefringence dispersion measurement by geometric phase

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Phase shifting, Polarization, Birefringence, Spectroscopy, Polarizers, Wave plates, Poincaré sphere, Modulators, LCDs, Phase measurement

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PROCEEDINGS ARTICLE | October 18, 2002

Reflection moiré for high spatial resolution

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Light sources, Moire patterns, Phase shifting, Reflection, Spatial frequencies, Image sensors, Charge-coupled devices, Spatial resolution, Camera shutters, Diffraction gratings

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PROCEEDINGS ARTICLE | October 18, 2002

Evaluation and discrimination method of mura in liquid crystal displays by just-noticeable-difference observation

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Edge detection, Digital image processing, Visualization, Imaging systems, Sensors, Image processing, Inspection, CCD cameras, LCDs, Analytical research

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PROCEEDINGS ARTICLE | October 18, 2002

Miniaturized machine moving in a pipe using photothermal effect

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Carbon, Opto mechatronics, Lamps, Magnetism, Head, Beam shaping, Photothermal effect, Halogens, Prototyping, Shape memory alloys

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PROCEEDINGS ARTICLE | October 18, 2002

Optimization in optics design of encoder using interference fringe

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Diffraction, Optical design, Light sources, Fringe analysis, Light emitting diodes, Data modeling, Sensors, Computer programming, Signal detection, Diffraction gratings

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PROCEEDINGS ARTICLE | October 18, 2002

Three-dimensional surface profile measurement using a liquid crystal grating with a triangular intensity distribution

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Glasses, Image processing, Photography, Phase shift keying, CCD cameras, Liquid crystals, Measurement devices, Signal detection, 3D image processing, Phase shifts

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SPIE Conference Volume | October 18, 2002

Optomechatronic Systems III

PROCEEDINGS ARTICLE | October 18, 2002

Two-dimensional movement of photothermal actuator composed of optical fibers

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Actuators, Optical fibers, Microscopes, Magnetism, Robots, Objectives, Photothermal effect, Systems engineering, Helium cadmium lasers, Optical actuators

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PROCEEDINGS ARTICLE | October 18, 2002

Surface profile measurement of concave-shaped mirror using grating projection method

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Mirrors, Opto mechatronics, Time metrology, Selenium

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PROCEEDINGS ARTICLE | September 20, 2002

Two-dimensional measurement of birefringence disperion using spectroscopic polarized light

Proc. SPIE. 4919, Advanced Materials and Devices for Sensing and Imaging

KEYWORDS: Light sources, Modulation, Birefringence, Quartz, Polymers, Spectroscopy, Phase shift keying, Polarizers, Polymer thin films, Light

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SPIE Journal Paper | September 1, 2002

Error dispersion algorithms to improve angle precision for and encoder

Matsuzoe, Yuji , Tsuji, Nobuhiko , Yoshizawa, Toru

OE Vol. 41 Issue 09

KEYWORDS: Photodetectors, Computer programming, Error analysis, Optical encoders, Distortion, Light emitting diodes, Data modeling, Fringe analysis, Optical engineering, Detection and tracking algorithms

PROCEEDINGS ARTICLE | February 11, 2002

Surface profile measurement of specular objects by grating projection method

Proc. SPIE. 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II

KEYWORDS: Mirrors, Imaging systems, Silicon, Reflectivity, CCD cameras, Phase measurement, CCD image sensors, Semiconducting wafers, 3D image processing, Phase shifts

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PROCEEDINGS ARTICLE | February 11, 2002

Structured lighting method using moire pattern projection

Proc. SPIE. 4567, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II

KEYWORDS: Moire patterns, CCD cameras, 3D metrology, Projection systems, Light sources and illumination, Liquid crystals, Transmittance, Binary data, Prototyping, Phase shifts

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PROCEEDINGS ARTICLE | November 26, 2001

Optical fiber strain gauge using a mirror with a pinhole

Proc. SPIE. 4448, Optical Diagnostics for Fluids, Solids, and Combustion

KEYWORDS: Optical fibers, Mirrors, Fiber optics, Sensors, Metals, Copper, Resistance, Systems engineering, Signal detection, Light

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PROCEEDINGS ARTICLE | October 23, 2001

Plastic disk inspection system: an approach using two-dimensional birefringence distribution measurement

Proc. SPIE. 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

KEYWORDS: Phase shifting, Polarization, Birefringence, Inspection, Polarizers, Wave plates, Polarimetry, CCD cameras, Helium neon lasers, Digital video discs

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PROCEEDINGS ARTICLE | October 23, 2001

Three-dimensional profilometry using hybrid grating projection

Proc. SPIE. 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

KEYWORDS: Moire patterns, Phase shifting, CCD cameras, 3D metrology, Projection systems, Liquid crystals, Transmittance, Binary data, Prototyping, Phase shifts

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PROCEEDINGS ARTICLE | October 4, 2001

Flatness measurement by UV moire

Proc. SPIE. 4564, Optomechatronic Systems II

KEYWORDS: Mirrors, Moire patterns, Phase shifting, Reflection, Glasses, Ultraviolet radiation, Error analysis, Time metrology, LCDs, Prototyping

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PROCEEDINGS ARTICLE | October 4, 2001

Photothermal actuator composed of optical fibers

Proc. SPIE. 4564, Optomechatronic Systems II

KEYWORDS: Actuators, Optical fibers, Mirrors, Switching, Opto mechatronics, Photography, Magnetism, Photothermal effect, Helium cadmium lasers, Optical actuators

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PROCEEDINGS ARTICLE | October 4, 2001

High-performance absolute optical encoder using M-code

Proc. SPIE. 4564, Optomechatronic Systems II

KEYWORDS: Light emitting diodes, Sensors, Distortion, Computer programming, Detector arrays, Optical encoders, Optical tracking, Signal detection, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | October 4, 2001

Solidification of resin in stereolithography: comparison between measured and estimated shapes of solidified resin, and manufacturing accuracy of photo-cured model

Proc. SPIE. 4564, Optomechatronic Systems II

KEYWORDS: Data modeling, Signal attenuation, Quartz, Glasses, Manufacturing, 3D modeling, Laser scanners, Solids, Optics manufacturing, Solid modeling

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PROCEEDINGS ARTICLE | October 4, 2001

Walking machine driven by a light beam

Proc. SPIE. 4564, Optomechatronic Systems II

KEYWORDS: Carbon, Switching, Opto mechatronics, Lamps, Magnetism, Beam shaping, Halogens, Prototyping, Optical actuators, Shape memory alloys

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SPIE Journal Paper | July 1, 2001

Shadow moire profilometry by frequency sweeping

Jin, Lianhua , Otani, Yukitoshi , Yoshizawa, Toru

OE Vol. 40 Issue 07

KEYWORDS: Light sources, Aluminum, Moire patterns, Fourier transforms, Semiconductor lasers, CCD cameras, Modulation, Optical engineering, Distance measurement, Computing systems

PROCEEDINGS ARTICLE | May 8, 2001

High-order birefringence and dispersion measurement using spectroscopy of polarized light

Proc. SPIE. 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)

KEYWORDS: Light sources, Modulation, Birefringence, Polymers, Spectroscopy, Polarizers, CCD cameras, Spectroscopes, Polymer thin films, Light

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PROCEEDINGS ARTICLE | February 12, 2001

Optical driving of a miniature machine composed of temperature-sensitive ferrite and shape memory alloy

Proc. SPIE. 4190, Optomechatronic Systems

KEYWORDS: Switching, Opto mechatronics, Metals, Materials processing, Magnetism, Beam shaping, Systems engineering, Body temperature, Prototyping, Shape memory alloys

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PROCEEDINGS ARTICLE | February 12, 2001

Uniaxis rangefinder using contrast detection of a projected pattern

Proc. SPIE. 4190, Optomechatronic Systems

KEYWORDS: Target detection, Imaging systems, Lenses, CCD cameras, Distance measurement, Charge-coupled devices, Phase measurement, Systems engineering, Phase shifts, Ranging

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PROCEEDINGS ARTICLE | November 15, 2000

High-order birefringence measurement using spectroscopic polarized light

Proc. SPIE. 4133, Polarization Analysis, Measurement, and Remote Sensing III

KEYWORDS: Modulation, Birefringence, Polymers, Spectroscopy, Fourier transforms, Polarizers, Wave plates, Tunable filters, Acousto-optics, Spectroscopes

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PROCEEDINGS ARTICLE | November 2, 2000

Error dispersion algorithms to improve the precision of angle detection for the optical encoder

Proc. SPIE. 4113, Algorithms and Systems for Optical Information Processing IV

KEYWORDS: Fringe analysis, Light emitting diodes, Detection and tracking algorithms, Data modeling, Sensors, Error analysis, Distortion, Computer programming, Optical encoders, Signal detection

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PROCEEDINGS ARTICLE | October 9, 2000

Shadow moire profilometry by frequency sweeping

Proc. SPIE. 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications

KEYWORDS: Light sources, Moire patterns, Modulation, Computing systems, Fourier transforms, Semiconductor lasers, CCD cameras, Distance measurement, Ytterbium, Aluminum

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SPIE Journal Paper | August 1, 2000

Shadow moire profilometry using the phase-shifting method

Jin, Lianhua , Kodera, Yutaka , Yoshizawa, Toru , Otani, Yukitoshi

OE Vol. 39 Issue 08

KEYWORDS: Phase shifts, Image processing, CCD cameras, Light sources, Moire patterns, Phase shifting, Optical engineering, Computing systems, 3D image processing, Aluminum

PROCEEDINGS ARTICLE | July 6, 2000

Disk inspection system by two-dimensional birefringence distribution measurement

Proc. SPIE. 4081, Optical Storage and Optical Information Processing

KEYWORDS: Phase shifting, Birefringence, Calibration, Inspection, Polarimetry, CCD cameras, Phase measurement, Digital video discs, Molybdenum, Optical discs

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PROCEEDINGS ARTICLE | June 14, 2000

Phase-shifting method for two-dimensional birefringence measurement with return-path beams

Proc. SPIE. 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing

KEYWORDS: Mirrors, Beam splitters, Polarization, Birefringence, Cameras, Wave plates, Polarimetry, CCD cameras, Laser beam diagnostics, Phase shifts

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PROCEEDINGS ARTICLE | November 11, 1999

Three-dimensional surface profilometry using structured liquid crystal grating

Proc. SPIE. 3782, Optical Manufacturing and Testing III

KEYWORDS: Optical filters, Phase shifting, Glasses, Crystals, CCD cameras, 3D metrology, Projection systems, Liquid crystals, Phase measurement, Phase shifts

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PROCEEDINGS ARTICLE | October 25, 1999

Return-path polarimeter for two-dimensional birefringence distribution measurement

Proc. SPIE. 3754, Polarization: Measurement, Analysis, and Remote Sensing II

KEYWORDS: Beam splitters, Polarization, Birefringence, Calibration, Wave plates, Polarimetry, CCD cameras, Measurement devices, Phase measurement, Helium neon lasers

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PROCEEDINGS ARTICLE | May 7, 1999

Three-dimensional surface measurement using grating projection method by detecting phase and contrast

Proc. SPIE. 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99)

KEYWORDS: Confocal microscopy, Phase shifting, Glasses, Manufacturing, Inspection, CCD cameras, Objectives, Phase measurement, Systems engineering, Optics manufacturing

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PROCEEDINGS ARTICLE | May 7, 1999

Shadow moire profilometry using a phase-shifting method

Proc. SPIE. 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99)

KEYWORDS: Light sources, Moire patterns, Phase shifting, Lithium, Silicon, CCD cameras, Aluminum, Focus stacking software, Osmium, Phase shifts

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PROCEEDINGS ARTICLE | June 30, 1998

Precise measurement of nonoptical surfaces by an oblique incidence interferometer

Proc. SPIE. 3478, Laser Interferometry IX: Techniques and Analysis

KEYWORDS: Prisms, Phase shifting, Reflection, Spatial filters, Interferometers, Silicon, Inspection, CCD cameras, Semiconducting wafers, Phase shifts

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PROCEEDINGS ARTICLE | June 30, 1998

Flatness measurement by a UV moire technique

Proc. SPIE. 3478, Laser Interferometry IX: Techniques and Analysis

KEYWORDS: Optical components, Moire patterns, Phase shifting, Glasses, Ultraviolet radiation, Ceramics, Time metrology, LCDs, Phase measurement, Semiconducting wafers

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SPIE Journal Paper | January 1, 1998

Measurement of nonoptical surfaces for Poisson's ratio value analysis by oblique incidence interferometry

Otani, Yukitoshi , Okuhara, Naoko , Yoshizawa, Toru

OE Vol. 37 Issue 01

KEYWORDS: Interferometers, Phase shifts, Ceramics, Interferometry, Prisms, Fringe analysis, CCD cameras, Holography, Agriculture, CCD image sensors

PROCEEDINGS ARTICLE | September 17, 1997

Optical heterodyne light source using laser diodes and its application to hybrid measurement

Proc. SPIE. 3098, Optical Inspection and Micromeasurements II

KEYWORDS: Beam splitters, Light sources, Modulation, Polarization, Interferometers, Phase shift keying, Semiconductor lasers, Heterodyning, Diodes, Signal detection

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PROCEEDINGS ARTICLE | November 4, 1996

Flatness measurement by reflection moire technique

Proc. SPIE. 2862, Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays

KEYWORDS: Light sources, Moire patterns, Phase shifting, Silica, Reflection, Lenses, Glasses, Ultraviolet radiation, LCDs, Semiconducting wafers

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SPIE Conference Volume | August 16, 1996

International Symposium on Polarization Analysis and Applications to Device Technology

PROCEEDINGS ARTICLE | August 16, 1996

Vibration detection using photorefractive two-wave mixing in KNSBN:Cu crystal and its polarization effect

Proc. SPIE. 2873, International Symposium on Polarization Analysis and Applications to Device Technology

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PROCEEDINGS ARTICLE | August 16, 1996

Measurement of two-dimensional birefringence distribution for laser materials

Proc. SPIE. 2873, International Symposium on Polarization Analysis and Applications to Device Technology

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PROCEEDINGS ARTICLE | July 17, 1996

Nonoptical surface measurement by oblique incidence interferometry

Proc. SPIE. 2860, Laser Interferometry VIII: Techniques and Analysis

KEYWORDS: Prisms, Fringe analysis, Phase shifting, Holography, Interferometers, Ceramics, Interferometry, CCD cameras, Helium neon lasers, Phase shifts

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PROCEEDINGS ARTICLE | July 17, 1996

Precise surface measurement by local sampling phase shifting technique

Proc. SPIE. 2860, Laser Interferometry VIII: Techniques and Analysis

KEYWORDS: Fringe analysis, Phase shifting, Polarization, Birefringence, Interferometers, Calibration, CCD cameras, Phase measurement, Analog electronics, Phase shifts

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SPIE Journal Paper | April 1, 1996

Light source with orthogonally linear polarized two-frequency beam from laser diode and surface profile measurement

Otani, Yukitoshi , Tanahashi, Atsushi , Yoshizawa, Toru

OE Vol. 35 Issue 04

KEYWORDS: Semiconductor lasers, Light sources, Heterodyning, Modulation, Beam splitters, Signal detection, Interferometers, Frequency modulation, Interferometry

PROCEEDINGS ARTICLE | August 2, 1995

Light source with orthogonally linear polarized two-frequency beam from laser diode and its application

Proc. SPIE. 2576, International Conference on Optical Fabrication and Testing

KEYWORDS: Prisms, Beam splitters, Light sources, Modulation, Polarization, Interferometers, Semiconductor lasers, Heterodyning, Frequency modulation, Signal detection

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PROCEEDINGS ARTICLE | September 14, 1994

Polariscope using the phase-shifting technique

Proc. SPIE. 2265, Polarization Analysis and Measurement II

KEYWORDS: Phase shifting, Polishing, Polarization, Birefringence, Signal attenuation, Calibration, Polarizers, Phase measurement, Signal detection, Phase shifts

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SPIE Journal Paper | May 1, 1994

Two-dimensional birefringence measurement using the phase shifting technique

Otani, Yukitoshi , Shimada, Takuya , Yoshizawa, Toru , Umeda, Norihiro

OE Vol. 33 Issue 05

KEYWORDS: Birefringence, Polarization, Phase shifting, Phase measurement, Error analysis, Linear polarizers, Phase shifts, Wave plates, CCD cameras, Optical components

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SPIE Journal Paper | April 1, 1994

Magnetostatic field measurement by optical heterodyne method with magnetic fluids

Otani, Yukitoshi , Yoshizawa, Toru , Tanahashi, Atsushi

OE Vol. 33 Issue 04

KEYWORDS: Magnetism, Birefringence, Sensors, Magnetic sensors, Heterodyning, Optical testing, Fiber optics sensors, Optical isolators, Temperature metrology, Signal detection

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SPIE Journal Paper | July 1, 1993

Shadow moiré topography by means of the phase-shift method

Yoshizawa, Toru , Tomisawa, Teiyu

OE Vol. 32 Issue 07

KEYWORDS: Moire patterns, Phase shifts, Light sources, Phase shifting, Image processing, Profilometers, Shape analysis, Fringe analysis, CCD cameras, 3D modeling

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PROCEEDINGS ARTICLE | February 15, 1993

Displacement measurement by the detection of contrast variation of a projected pattern

Proc. SPIE. 1756, Interferometry: Applications

KEYWORDS: Mirrors, Light sources, Sensors, Interferometry, Photodiodes, Optical testing, Signal processing, Objectives, Diodes, Signal detection

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PROCEEDINGS ARTICLE | February 15, 1993

Optical heterodyne measurement of magnetic field using magnetic fluid

Proc. SPIE. 1756, Interferometry: Applications

KEYWORDS: Mirrors, Birefringence, Sensors, Particles, Magnetism, Polarizers, Optical testing, Heterodyning, Laser stabilization, Magnetic sensors

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PROCEEDINGS ARTICLE | October 20, 1992

Two-dimensional birefringence measurement using the phase-shifting technique

Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

KEYWORDS: Optical components, Linear polarizers, Prisms, Phase shifting, Polarization, Birefringence, Error analysis, CCD cameras, Phase measurement, Phase shifts

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PROCEEDINGS ARTICLE | October 20, 1992

Talbot projected 3D profilometry by means of one-step phase-shift algorithms

Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

KEYWORDS: Fringe analysis, Imaging systems, Image processing, Interferometry, Wavefronts, CCD cameras, Profiling, 3D metrology, Phase measurement, Phase shifts

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SPIE Journal Paper | August 1, 1992

Displacement measurement utilizing contrast variation of a projected pattern

Yoshizawa, Toru , Tochigi, Akiyoshi

OE Vol. 31 Issue 08

KEYWORDS: Signal detection, Objectives, Optical testing, Light sources, Photodiodes, Sensors, Diodes, Signal processing, Geometrical optics, Spectral resolution

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PROCEEDINGS ARTICLE | December 1, 1991

Moire topography with the aid of phase-shift method

Proc. SPIE. 1554, Second International Conference on Photomechanics and Speckle Metrology

KEYWORDS: Light sources, Moire patterns, Fringe analysis, Mechanics, Image processing, CCD cameras, Profilometers, Aluminum, Holographic interferometry, Phase shifts

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SPIE Journal Paper | October 1, 1991

Three-dimensional shape analysis by use of a projected grating image

Suganuma, Miwa , Yoshizawa, Toru

OE Vol. 30 Issue 10

KEYWORDS: Moire patterns, Shape analysis, Visibility, 3D modeling, 3D image processing, Image processing, Image analysis, Phase shifts, Spatial frequencies, CCD cameras

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