Prof. Toru Yoshizawa
at Tokyo Univ of Agriculture and Technology
SPIE Involvement:
Fellow status | Conference Program Committee | Conference Co-Chair | Conference Chair | Symposium Committee | Symposium Chair | Author | Editor
Publications (119)

PROCEEDINGS ARTICLE | November 2, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Image processing, Optical testing, Image filtering, Geometrical optics, Optical instrument design, Optics manufacturing

SPIE Conference Volume | January 19, 2017

SPIE Conference Volume | December 10, 2014

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Mirrors, Fringe analysis, Oncology, Cancer, Cameras, Semiconductor lasers, Radiotherapy, Stereoscopic cameras, 3D metrology, Projection systems

Showing 5 of 119 publications
Conference Committee Involvement (38)
Applied Optical Metrology III
11 August 2019 | San Diego, California, United States
Optical Technology and Measurement for Industrial Applications Conference
24 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Showing 5 of 38 published special sections
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