Mr. Toshiharu Watarai
at Tokyo Univ of Agriculture and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 19, 2013
Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II
KEYWORDS: Scattering, Cameras, Optical coherence tomography, Particles, Interfaces, Diffusion, Light scattering, CCD cameras, Dynamic light scattering, Liquids

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