Toshihide Kikkawa
at Fujitsu Labs Ltd
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

Proceedings Article | 28 February 2008
Proc. SPIE. 6894, Gallium Nitride Materials and Devices III
KEYWORDS: Electrodes, Reliability, Amplifiers, Electronic components, Gallium nitride, Telecommunications, Field effect transistors, Silicon carbide, Wireless communications, Failure analysis

Conference Committee Involvement (2)
Gallium Nitride Materials and Devices V
25 January 2010 | San Francisco, California, United States
Gallium Nitride Materials and Devices IV
26 January 2009 | San Jose, California, United States
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