Prof. Toshitaka Wakayama Profile

Prof. Toshitaka Wakayama

Instructor at Saitama Medical Univ

SPIE Involvement:

Conference Program Committee | Author

Publications (30)

PROCEEDINGS ARTICLE | November 13, 2014

Compact camera for 3D position registration of cancer in radiation treatment

Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III

KEYWORDS: Mirrors, Fringe analysis, Oncology, Cancer, Cameras, Semiconductor lasers, Radiotherapy, Stereoscopic cameras, 3D metrology, Projection systems

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PROCEEDINGS ARTICLE | May 28, 2014

Optical center alignment technique based on inner profile measurement method

Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III

KEYWORDS: Ellipsometry, Mirrors, Spindles, Inspection, Receivers, Semiconductor lasers, CCD cameras, Beam shaping, Optical alignment, Optics manufacturing

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SPIE Journal Paper | April 9, 2014

High-speed three-dimensional shape measurements using multiwavelength spatiotemporal phase shifting

Wakayama, Toshitaka , Yoshizawa, Toru

OE Vol. 53 Issue 11

KEYWORDS: 3D metrology, Phase shifts, Fringe analysis, Phase shifting, Projection systems, Semiconductor lasers, Digital Light Processing, Cameras, Mirrors, RGB color model

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PROCEEDINGS ARTICLE | September 27, 2013

Evaluation of Mueller matrix of achromatic axially symmetric wave plate

Proc. SPIE. 8873, Polarization Science and Remote Sensing VI

KEYWORDS: Optical components, Polishing, Biomedical optics, Silica, Polarization, Reflection, Dispersion, Polarizers, Wave plates, Polarimetry

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PROCEEDINGS ARTICLE | September 6, 2013

Uni-axial inner profile measurement

Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II

KEYWORDS: Optical fibers, Mirrors, Beam splitters, Light sources, Polarizers, Semiconductor lasers, CCD cameras, 3D metrology, Charge-coupled devices, Beam shaping

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PROCEEDINGS ARTICLE | June 25, 2013

State of the art of compact optical 3D profile measurement apparatuses: from outer surface to inner surface measurement

Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)

KEYWORDS: Microelectromechanical systems, Optical fibers, Mirrors, Cameras, Optical testing, Semiconductor lasers, CCD cameras, Collimation, 3D metrology, Projection systems

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PROCEEDINGS ARTICLE | November 20, 2012

Small size probe for inner profile measurement of pipes using optical fiber ring beam device

Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II

KEYWORDS: Optical fibers, Mirrors, Cameras, Ions, Inspection, Optical testing, Collimators, 3D metrology, Charge-coupled devices, Indium nitride

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PROCEEDINGS ARTICLE | September 13, 2012

An interferometric observation of topological effect by novel axially symmetrical wave plate

Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis

KEYWORDS: Optical components, Polymethylmethacrylate, Silica, Polarization, Manufacturing, Interferometry, Polarizers, Wave plates, Optical vortices, Spiral phase plates

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SPIE Journal Paper | January 31, 2012

Compact camera for three-dimensional profilometry incorporating a single MEMS mirror

Wakayama, Toshitaka , Yoshizawa, Toru

OE Vol. 51 Issue 1

KEYWORDS: Mirrors, Microelectromechanical systems, Cameras, Stereoscopic cameras, Semiconductor lasers, Projection systems, LCDs, 3D metrology, CCD cameras, Calibration

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PROCEEDINGS ARTICLE | September 14, 2011

Development of a probe for inner profile measurement and flaw detection

Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications

KEYWORDS: Optical components, Mirrors, Prisms, Cameras, Glasses, Inspection, Optical testing, Semiconductor lasers, CCD cameras, Defect inspection

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PROCEEDINGS ARTICLE | September 10, 2011

Color pattern projection method for three-dimensional measurement

Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications

KEYWORDS: Microelectromechanical systems, Mirrors, Cameras, Semiconductor lasers, Time metrology, Image sensors, Stereoscopic cameras, 3D metrology, Projection systems, Digital micromirror devices

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PROCEEDINGS ARTICLE | November 11, 2010

Development of an inner profile measurement instrument using a ring beam device

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Optical components, Mirrors, Medicine, Cameras, Glasses, Inspection, Semiconductor lasers, CCD cameras, CMOS cameras, Dentistry

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Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and other industrial applications. Here we describe recent development of our measurement principle for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without using any contact type stylus. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In our hitherto trial experimental works, the availability of this instrument has been evaluated in many cases and availability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disk-like light sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument at this point. Both the ring beam device and a miniaturized CCD camera are fabricated into a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose potentially possible method for measurement of external profile at the same time with internal profile. If one pair of concave mirrors are used in our arrangement, external profile is captured. In combination with inner profile measurement technique, simultaneous measurement of inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of here proposed principle. In addition, we are trying to extend our technique to check defects and/or flaws on the inner wall of pipe-like objects.

PROCEEDINGS ARTICLE | November 11, 2010

Spectroscopic topological Stokes polarimeter

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Light sources, Polarization, Birefringence, Spectroscopy, Polarizers, Wave plates, Polarimetry, Charge-coupled devices, Optical alignment, Spiral phase plates

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PROCEEDINGS ARTICLE | November 11, 2010

A palm-top camera for 3D profilometry incorporating a MEMS scanner

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Microelectromechanical systems, Mirrors, Cameras, Scanners, Semiconductor lasers, Laser scanners, Image sensors, Stereoscopic cameras, 3D metrology, 3D scanning

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PROCEEDINGS ARTICLE | November 24, 2009

Measurement of inner and/or outer profiles of pipes using ring beam devices

Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology

KEYWORDS: Optical components, Refractive index, Mirrors, Medicine, Cameras, Glasses, Inspection, Semiconductor lasers, CMOS cameras, Dentistry

Read Abstract

Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and industry. Here we propose a measurement method for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without any contact probe. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In the hitherto-tried experimental works, the availability of this instrument has been highly evaluated and usability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disklike light beam sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument. Both the ring beam device and a miniaturized CCD camera are fabricated in a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose an improved method for measuring the external profile in addition to the internal profile. In our arrangement, one pair of concaved conical mirrors is used for the external profile measurement. In combination with the inner profile measurement technique, simultaneous measurement of the inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of newly proposed principle. Now we are aiming to realize simultaneous measurement of the internal and external profiles of various types of pipes and similar objects.

PROCEEDINGS ARTICLE | September 10, 2009

Three-dimensional profilometry system incorporating a MEMS scanner

Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries

KEYWORDS: Microelectromechanical systems, Mirrors, Imaging systems, Cameras, Scanners, Laser scanners, Stereoscopic cameras, 3D metrology, Projection systems, 3D scanning

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PROCEEDINGS ARTICLE | August 12, 2009

Axisymmetrical Mueller matrix polarimeter

Proc. SPIE. 7461, Polarization Science and Remote Sensing IV

KEYWORDS: Mirrors, Axicons, Modulation, Polarization, Sensors, Polarizers, Wave plates, Polarimetry, CCD cameras, CCD image sensors

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PROCEEDINGS ARTICLE | November 17, 2008

Generation of vortex spectra based on geometric phase for optical tweezers

Proc. SPIE. 7266, Optomechatronic Technologies 2008

KEYWORDS: Light sources, Polarization, Particles, Polarizers, Wave plates, Spatial light modulators, Optical tweezers, Geometrical optics, Spiral phase plates, Dielectric polarization

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PROCEEDINGS ARTICLE | August 29, 2008

Simultaneous measurement of internal and external profiles using a ring beam device

Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI

KEYWORDS: Mirrors, Cameras, Glasses, Inspection, Optical testing, Semiconductor lasers, CCD cameras, Precision measurement, 3D metrology, Beam shaping

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PROCEEDINGS ARTICLE | October 10, 2007

Development of a compact inner profile measuring instrument

Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V

KEYWORDS: Optical components, Refractive index, Mirrors, CMOS sensors, Cameras, Calibration, Glasses, Error analysis, Inspection, Semiconductor lasers

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PROCEEDINGS ARTICLE | October 10, 2007

Applications of a MEMS scanner to profile measurement

Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V

KEYWORDS: Microelectromechanical systems, Mirrors, Fringe analysis, Scanners, Manufacturing, Laser scanners, 3D metrology, 3D scanning, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | October 12, 2006

White light displacement sensor by spectro-polarization modulator

Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV

KEYWORDS: Chromatic aberrations, Light sources, Optical sensors, Polarization, Sensors, Spectroscopy, Polarizers, Wave plates, Modulators, Spectroscopes

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PROCEEDINGS ARTICLE | October 12, 2006

Inner profile measurement of pipes and holes using a ring beam device

Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV

KEYWORDS: Mirrors, Prisms, Polishing, Optical fabrication equipment, Cameras, Inspection, Optical testing, CCD cameras, Charge-coupled devices, Liquids

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PROCEEDINGS ARTICLE | August 14, 2006

Displacement measurement by spectro-polarization modulator

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Chromatic aberrations, Mirrors, Light sources, Polarization, Spectroscopy, Polarizers, Wave plates, Modulators, CCD cameras, Colorimetry

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SPIE Journal Paper | August 1, 2006

Birefringence dispersion measurement based on achromatic four points of geometric phase

Wakayama, Toshitaka , Otani, Yukitoshi , Umeda, Norihiro

OE Vol. 45 Issue 08

KEYWORDS: Birefringence, Polarization, Poincaré sphere, Error analysis, Spectroscopy, Light sources, Phase shifting, Polarizers, Crystal optics, Optical engineering

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SPIE Journal Paper | March 1, 2006

Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light

Wakayama, Toshitaka , Kowa, Hiroyuki , Otani, Yukitoshi , Umeda, Norihiro , Yoshizawa, Toru

OE Vol. 45 Issue 03

KEYWORDS: Birefringence, Spectroscopy, Polarizers, Quartz, Modulation, Optical engineering, Wave plates, CCD cameras, Acousto-optics, Tunable filters

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PROCEEDINGS ARTICLE | August 18, 2005

Real-time measurement for birefringence dispersion using double retarder

Proc. SPIE. 5888, Polarization Science and Remote Sensing II

KEYWORDS: Light sources, Modulation, Birefringence, Spectroscopy, Manufacturing, Fourier transforms, Amplifiers, Polarizers, Wave plates, Light

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PROCEEDINGS ARTICLE | October 18, 2002

Birefringence dispersion measurement by geometric phase

Proc. SPIE. 4902, Optomechatronic Systems III

KEYWORDS: Phase shifting, Polarization, Birefringence, Spectroscopy, Polarizers, Wave plates, Poincaré sphere, Modulators, LCDs, Phase measurement

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PROCEEDINGS ARTICLE | September 20, 2002

Two-dimensional measurement of birefringence disperion using spectroscopic polarized light

Proc. SPIE. 4919, Advanced Materials and Devices for Sensing and Imaging

KEYWORDS: Light sources, Modulation, Birefringence, Quartz, Polymers, Spectroscopy, Phase shift keying, Polarizers, Polymer thin films, Light

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PROCEEDINGS ARTICLE | May 8, 2001

High-order birefringence and dispersion measurement using spectroscopy of polarized light

Proc. SPIE. 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)

KEYWORDS: Light sources, Modulation, Birefringence, Polymers, Spectroscopy, Polarizers, CCD cameras, Spectroscopes, Polymer thin films, Light

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Showing 5 of 30 publications

Conference Committee Involvement (3)

Optical Metrology and Inspection for Industrial Applications V

11 October 2018 | Beijing, China

Optical Metrology and Inspection for Industrial Applications IV

12 October 2016 | Beijing, China

Optical Metrology and Inspection for Industrial Applications III

9 October 2014 | Beijing, China

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