Prof. Toshitaka Wakayama
Instructor at Saitama Medical Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (30)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Mirrors, Fringe analysis, Oncology, Cancer, Cameras, Semiconductor lasers, Radiotherapy, Stereoscopic cameras, 3D metrology, Projection systems

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Ellipsometry, Mirrors, Spindles, Inspection, Receivers, Semiconductor lasers, CCD cameras, Beam shaping, Optical alignment, Optics manufacturing

SPIE Journal Paper | April 9, 2014
OE Vol. 53 Issue 11
KEYWORDS: 3D metrology, Phase shifts, Fringe analysis, Phase shifting, Projection systems, Semiconductor lasers, Digital Light Processing, Cameras, Mirrors, RGB color model

PROCEEDINGS ARTICLE | September 27, 2013
Proc. SPIE. 8873, Polarization Science and Remote Sensing VI
KEYWORDS: Optical components, Polishing, Biomedical optics, Silica, Polarization, Reflection, Dispersion, Polarizers, Wave plates, Polarimetry

PROCEEDINGS ARTICLE | September 6, 2013
Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II
KEYWORDS: Optical fibers, Mirrors, Beam splitters, Light sources, Polarizers, Semiconductor lasers, CCD cameras, 3D metrology, Charge-coupled devices, Beam shaping

PROCEEDINGS ARTICLE | June 25, 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Microelectromechanical systems, Optical fibers, Mirrors, Cameras, Optical testing, Semiconductor lasers, CCD cameras, Collimation, 3D metrology, Projection systems

Showing 5 of 30 publications
Conference Committee Involvement (4)
Optical Technology and Measurement for Industrial Applications Conference
24 April 2019 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
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