Mr. Tran Nam Nguyen
PhD Research Student at
SPIE Involvement:
Author
Area of Expertise:
optical metrology techniques , computer vision , digital image processing , numerical stress/strain analysis , experimental solid mechanics
Websites:
Publications (1)

SPIE Journal Paper | October 1, 2011
OE Vol. 50 Issue 10
KEYWORDS: Digital image correlation, 3D image processing, Cameras, 3D metrology, Error analysis, Clouds, Statistical analysis, Projection systems, Speckle pattern, Optical engineering

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