Travis Brist
Senior Product Marketing Manager at Synopsys Inc
SPIE Involvement:
Publications (19)

Proceedings Article | 18 April 2013 Paper
Peter Brooker, Michael Lee, Ezequiel Vidal Russel, Shimon Levi, Sylvain Berthiaume, William Stanton, Travis Brist
Proceedings Volume 8681, 868123 (2013)
KEYWORDS: Scanning electron microscopy, Metrology, Manufacturing, Optical proximity correction, Semiconducting wafers, Data modeling, Reticles, Feature extraction, Dysprosium, Data analysis

Proceedings Article | 5 April 2012 Paper
Sylvain Berthiaume, Travis Brist, Peter Brooker, William Stanton, Brian Ward, Shimon Levi, Amit Siany
Proceedings Volume 8324, 83241W (2012)
KEYWORDS: Scanning electron microscopy, Metrology, Data modeling, Optical proximity correction, Electronic design automation, Semiconducting wafers, Manufacturing, Computer aided design, Photomasks, Critical dimension metrology

Proceedings Article | 14 October 2011 Paper
Makoto Miyagi, Peter Brooker, Chander Sawh, Travis Brist, Kunal Taravade
Proceedings Volume 8166, 81663P (2011)
KEYWORDS: Lithography, 3D modeling, Optical proximity correction, Photomasks, Computer simulations, Semiconducting wafers, Wafer-level optics, Source mask optimization, Tolerancing, Data modeling

Proceedings Article | 2 April 2010 Paper
Brian Ward, Sylvain Berthiaume, Travis Brist, Peter Brooker
Proceedings Volume 7638, 76381W (2010)
KEYWORDS: Data modeling, Metrology, Scanning electron microscopy, Optical proximity correction, Calibration, Statistical modeling, Process modeling, Data analysis, Data visualization, Diffractive optical elements

Proceedings Article | 16 March 2009 Paper
Mathias Boman, Travis Brist, Yongdong Wang
Proceedings Volume 7274, 72742H (2009)
KEYWORDS: Optical proximity correction, Computed tomography, Photomasks, Electroluminescence, Lithium, Electronic design automation, Data processing, Manufacturing, Logic

Showing 5 of 19 publications
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