Travis C. Burt
Product Marketing Manager at Agilent Technologies Australia
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Diffraction, Reflection, Sensors, Spectroscopy, Reflectivity, Heart, Time metrology, Monochromators, Spectrophotometry, Diffraction gratings

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10110, Photonic Instrumentation Engineering IV
KEYWORDS: Thin films, Photonic devices, Dental caries, Reflection, Spectroscopy, Optical coatings, Reflectivity, Solids, Transmittance, Near infrared spectroscopy, Spatial resolution, Spectrophotometry, Semiconducting wafers

PROCEEDINGS ARTICLE | March 8, 2014
Proc. SPIE. 8992, Photonic Instrumentation Engineering
KEYWORDS: Dental caries, Silica, Reflection, Spectroscopy, Optical coatings, Reflectivity, Solids, Transmittance, Spectrophotometry, Semiconducting wafers

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