Travis Frazer
at JILA
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | April 23, 2018
Proc. SPIE. 10600, Health Monitoring of Structural and Biological Systems XII
KEYWORDS: Metamaterials, Ultrafast phenomena, Near infrared, Diffraction, Spectroscopy, Crystals, Extreme ultraviolet, Thermoelectric materials, Acoustics, Nanolithography

PROCEEDINGS ARTICLE | March 13, 2018
Proc. SPIE. 10585, Metrology, Inspection, and Process Control for Microlithography XXXII
KEYWORDS: Thin films, Nanostructures, Diffraction, Coherence imaging, Nanostructuring, Nickel, Silicon, Wave propagation, Extreme ultraviolet, Acoustics

PROCEEDINGS ARTICLE | April 21, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Thin films, Nanostructures, Metrology, Nanostructuring, Dielectrics, Physics, Thermal effects, Extreme ultraviolet, Phonons, Photoacoustic spectroscopy, Acoustics, Laser optics, Thermal modeling, Nanostructured thin films, Nanowires

PROCEEDINGS ARTICLE | March 19, 2015
Proc. SPIE. 9424, Metrology, Inspection, and Process Control for Microlithography XXIX
KEYWORDS: Nanostructures, Diffraction, Nanostructuring, Nickel, Thermal effects, Extreme ultraviolet, Phonons, Tantalum, Acoustics, Nanowires

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