Troy B. Alley
Application Engineer
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 November 2010
Proc. SPIE. 7842, Laser-Induced Damage in Optical Materials: 2010
KEYWORDS: Oxides, Polishing, Silica, Laser induced damage, Laser damage threshold, Q switched lasers, Cerium, Pulsed laser operation, Surface finishing, Plasma

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