Dr. Tsuyoshi Mihara
at Tohoku Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (2)

Proceedings Article | 22 July 2003
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Nanotechnology, Crystals, Silicon, Reliability, Nondestructive evaluation, Atomic force microscopy, Ultrasonics, Vibrometry, Solids, Finite element methods

Proceedings Article | 7 June 2002
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Diffraction, Mechanics, Calibration, Ultrasonography, Inspection, Nondestructive evaluation, Ultrasonics, Scanning electron microscopy, Transducers, Aluminum

Conference Committee Involvement (2)
Testing, Reliability, and Application of Micro-and Nano-Material Systems II
15 March 2004 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems
3 March 2003 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top