Dr. Tuan Hong Pham
at National Ctr for Technical Progress
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | October 5, 2005
Proc. SPIE. 5963, Advances in Optical Thin Films II
KEYWORDS: Thin films, Refractive index, Electron beams, Silica, Ions, Silicon, Laser scattering, Silicon films, Transmittance, Protactinium

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Mirrors, Argon, Sputter deposition, Metals, Silver, Coating, Reflectivity, Atomic force microscopy, Microwave radiation, Temperature metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top