Vasilica Țucureanu
at IMT-Bucharest
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | February 20, 2015
Proc. SPIE. 9258, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VII
KEYWORDS: Human-machine interfaces, FT-IR spectroscopy, Polymethylmethacrylate, Polymers, Metals, Interfaces, Control systems, Scanning electron microscopy, Microwave radiation, Liquids

PROCEEDINGS ARTICLE | January 7, 2009
Proc. SPIE. 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
KEYWORDS: Oxides, Thin films, FT-IR spectroscopy, Gas sensors, Titanium, Titanium dioxide, Annealing, Coating, Scanning electron microscopy, Sol-gels

PROCEEDINGS ARTICLE | January 7, 2009
Proc. SPIE. 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
KEYWORDS: FT-IR spectroscopy, Titanium, Titanium dioxide, Nanoparticles, Polymers, Particles, Molecules, Composites, Scanning electron microscopy, Polymer thin films

PROCEEDINGS ARTICLE | May 8, 2007
Proc. SPIE. 6635, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies III
KEYWORDS: Oxides, Light emitting diodes, Crystals, Light sources and illumination, Aluminum, Sol-gels, YAG lasers, Garnet, Yttrium, Cerium

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