Dr. Tuvy Markovitz
Project Manager at SCD Semiconductor Devices
SPIE Involvement:
Author
Publications (11)

PROCEEDINGS ARTICLE | June 18, 2013
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Staring arrays, Signal to noise ratio, Mid-IR, Sensors, Diffusion, Gallium antimonide, Atmospheric sensing, Atmospheric optics, Temperature metrology, Single crystal X-ray diffraction

SPIE Journal Paper | June 1, 2011
OE Vol. 50 Issue 06
KEYWORDS: Sensors, Readout integrated circuits, Staring arrays, Infrared sensors, Modulation transfer functions, Mid-IR, Nonuniformity corrections, Single crystal X-ray diffraction, Analog electronics, Temperature metrology

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared sensors, Sensors, Interference (communication), Image quality, Missiles, Analog electronics, Signal detection, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | May 21, 2011
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Readout integrated circuits, Thermography, Infrared imaging, Mid-IR, Short wave infrared radiation, Capacitors, Sensors, Laser range finders, Signal detection, Pulsed laser operation

PROCEEDINGS ARTICLE | May 14, 2007
Proc. SPIE. 6542, Infrared Technology and Applications XXXIII
KEYWORDS: Staring arrays, Readout integrated circuits, Nonuniformity corrections, Sensors, Manufacturing, Image quality, Modulation transfer functions, Standards development, Image quality standards, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | May 17, 2006
Proc. SPIE. 6206, Infrared Technology and Applications XXXII
KEYWORDS: Staring arrays, Digital signal processing, Sensors, Argon, Signal processing, Diodes, Aluminum, Missiles, Temperature metrology, Single crystal X-ray diffraction

Showing 5 of 11 publications
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