Dr. Tyler R. Roschuk
at Raytheon ELCAN Optical Technologies
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | May 11, 2017
Proc. SPIE. 10181, Advanced Optics for Defense Applications: UV through LWIR II
KEYWORDS: Near infrared, Modeling, Thin films, Antireflective coatings, Multilayers, Coating, Resistance, Reflectivity, Oxygen, Transparent conductive coatings, Absorption

PROCEEDINGS ARTICLE | December 20, 2004
Proc. SPIE. 5577, Photonics North 2004: Optical Components and Devices
KEYWORDS: Oxides, Thin films, Refractive index, FT-IR spectroscopy, Argon, Annealing, Luminescence, Silicon, Silicon films, Nanocrystals

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