In this paper the crystalline and morphological properties of Pd thin films deposited on glass substrate by pulsed laser
deposition (PLD) technique at different substrate temperatures have been investigated. These films were deposited with
an excimer (XeCl) laser source (λ= 308 nm, pulse duration of 30 ns, repetition rate of 10 Hz).The fabricated films were
characterized by various methods such as X-ray diffraction (XRD) and atomic force microscopy (AFM). The thickness
and refractive index of samples were measured using ellipsometry. There was influence of substrate temperature on the
surface roughness of thin film. The rms roughness increases with increasing temperature. As the temperature increase the
crystallinity of the film also increases.
This work describes a homogeneous single layer model for surface roughness by polarized light. It has been shown that
the reflectance change in non-absorbing layer is directly proportional to the refractive index of the ambient and substrate
media for s polarization but inversely proportional to the p polarization and it is directly proportional to the square of the
thickness of the layer for both the polarization. The thickness of the film has been written in terms of surface roughness
to correlate the homogeneous model with the scattering theory. The consequence of the scattered light on the specular
reflectance and transmittance for oblique incidence shows that there is reduction in reflectance and transmittance, due to
roughness on the surface under the Drude effective-medium approximation.
In this paper homogeneous model for surface roughness in identical layer system has been presented. It has been shown that reflectance change in non-absorbing layer is directly proportional to the square of total thickness of the layers. The reflectance in the visible range of the wavelength changes (decreases) substantially when the roughness factor or the number of layers are increases. In the present model the reflectance of the double layer system can be explained with the help of only one parameter that is roughness factor σ.