Ufuk Ceyhan
at Hochschule Bremen Univ of Applied Sciences
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Optical components, Refractive index, Optical design, Wavefronts, Wavefront aberrations, Optical testing, Refraction, Ray tracing, Profilometers, Aspheric lenses

Proceedings Article | 17 June 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Monochromatic aberrations, Light sources, Cameras, Sensors, Inspection, Wavefronts, Zernike polynomials, Wavefront analysis, Aspheric lenses, Optical aberrations

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