Dr. Ulf Griesmann
at National Institute of Standards and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (20)

PROCEEDINGS ARTICLE | August 9, 2016
Proc. SPIE. 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
KEYWORDS: Diffraction, Optical design, Interferometers, Spectroscopy, Wavefronts, Computer generated holography, Collimation, Chemical elements, Prototyping, Diffraction gratings

PROCEEDINGS ARTICLE | July 22, 2016
Proc. SPIE. 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
KEYWORDS: Lithography, Electron beam lithography, Antireflective coatings, Etching, Silicon, Manufacturing, Chromium, Photoresist materials, Photomasks, Semiconducting wafers

SPIE Journal Paper | October 23, 2013
OE Vol. 52 Issue 10
KEYWORDS: Glasses, Lithography, Photoresist materials, Chromium, Reflectivity, Antireflective coatings, Computer generated holography, Refractive index, Photomasks, Optical lithography

PROCEEDINGS ARTICLE | September 7, 2013
Proc. SPIE. 8838, Optical Manufacturing and Testing X
KEYWORDS: Confocal microscopy, Holography, Optical spheres, Lenses, Interferometers, Error analysis, Wavefronts, Lens design, Optical fabrication, Spherical lenses

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Polyurethane, Foam, Interferometers, Calibration, Polymers, Glasses, Silicon, Nanoimprint lithography, Precision optics, Protactinium

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: Monochromatic aberrations, Optical spheres, Interferometers, Error analysis, Interferometry, Wavefronts, Distortion, Monte Carlo methods, Analytical research, Spherical lenses

Showing 5 of 20 publications
Conference Committee Involvement (7)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
Showing 5 of 7 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top