Dr. Ulf Griesmann
at National Institute of Standards and Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (23)

PROCEEDINGS ARTICLE | September 4, 2018
Proc. SPIE. 10750, Reflection, Scattering, and Diffraction from Surfaces VI
KEYWORDS: Lithography, Diffraction, Holograms, High dynamic range imaging, Stray light, Diffraction gratings

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Monochromatic aberrations, Visualization, Spatial frequencies, Interferometers, Modulation transfer functions, Fizeau interferometers

SPIE Journal Paper | July 14, 2018
OE Vol. 57 Issue 07
KEYWORDS: Computer generated holography, Infrared radiation, Interferometers, Interferometry, Wavefronts, Optical design, Phase shifts, Infrared telescopes, Diffraction, Prototyping

PROCEEDINGS ARTICLE | August 9, 2016
Proc. SPIE. 9904, Space Telescopes and Instrumentation 2016: Optical, Infrared, and Millimeter Wave
KEYWORDS: Diffraction, Optical design, Interferometers, Spectroscopy, Wavefronts, Computer generated holography, Collimation, Chemical elements, Prototyping, Diffraction gratings

PROCEEDINGS ARTICLE | July 22, 2016
Proc. SPIE. 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
KEYWORDS: Lithography, Electron beam lithography, Antireflective coatings, Etching, Silicon, Manufacturing, Chromium, Photoresist materials, Photomasks, Semiconducting wafers

SPIE Journal Paper | October 23, 2013
OE Vol. 52 Issue 10
KEYWORDS: Glasses, Lithography, Photoresist materials, Chromium, Reflectivity, Antireflective coatings, Computer generated holography, Refractive index, Photomasks, Optical lithography

Showing 5 of 23 publications
Conference Committee Involvement (7)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
Showing 5 of 7 published special sections
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