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Ulf J. Wallgren
Senior Company Specialist at FLIR Systems AB
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Publications (1)
Proceedings Article | 30 August 2004 Paper
Characterization of transfer-bonded silicon bolometer arrays
Frank Niklaus, Johan Pejnefors, Matteo Dainese, Michael Haggblad, Per-Erik Hellstrom, Ulf Wallgren, Goran Stemme
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.565894
KEYWORDS: Bolometers, Silicon, Semiconducting wafers, Readout integrated circuits, Infrared detectors, Resistors, Infrared bolometers, Material characterization, Wafer bonding, Boron
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