Dr. Ulrich Weichmann
at Philips Technologie GmbH
SPIE Involvement:
Author
Publications (10)

PROCEEDINGS ARTICLE | March 4, 2016
Proc. SPIE. 9733, High-Power Diode Laser Technology and Applications XIV
KEYWORDS: Polymers, High power lasers, Laser processing, Reliability, Resistance, Integrated optics, Vertical cavity surface emitting lasers, Semiconducting wafers, Laser systems engineering

PROCEEDINGS ARTICLE | March 13, 2015
Proc. SPIE. 9348, High-Power Diode Laser Technology and Applications XIII
KEYWORDS: Light emitting diodes, High power lasers, Photography, Manufacturing, Reliability, Lamps, Heat treatments, Vertical cavity surface emitting lasers, Semiconducting wafers, Laser systems engineering

PROCEEDINGS ARTICLE | March 4, 2015
Proc. SPIE. 9381, Vertical-Cavity Surface-Emitting Lasers XIX
KEYWORDS: Oxides, Mirrors, Quantum wells, Doping, 3D modeling, Vertical cavity surface emitting lasers, Electro optics, Optimization (mathematics), Electro optical modeling, Instrument modeling

SPIE Journal Paper | January 23, 2015
OE Vol. 54 Issue 01
KEYWORDS: Quantum wells, Vertical cavity surface emitting lasers, Electro optical modeling, Electrons, 3D modeling, Mirrors, Data modeling, Electro optics, Calibration, Temperature metrology

PROCEEDINGS ARTICLE | May 2, 2014
Proc. SPIE. 9134, Semiconductor Lasers and Laser Dynamics VI
KEYWORDS: Mirrors, Quantum wells, Data modeling, Calibration, Electrons, Semiconductor lasers, Laser damage threshold, Vertical cavity surface emitting lasers, Electro optics, Electro optical modeling

PROCEEDINGS ARTICLE | March 3, 2014
Proc. SPIE. 8966, Vertical External Cavity Surface Emitting Lasers (VECSELs) IV
KEYWORDS: Oxides, Mirrors, Resonators, High power lasers, Doping, Electroluminescence, Optical testing, Vertical cavity surface emitting lasers, Semiconducting wafers, Near field optics

Showing 5 of 10 publications
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