Umut Tunca Sanli
at Max-Planck-Institut für Intelligente Systeme
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | 31 August 2018
OE Vol. 57 Issue 08
KEYWORDS: Sensors, Diffraction, Imaging systems, Detection and tracking algorithms, Convolution, Fourier transforms, Calibration, Visible radiation, Optical engineering, Spatial coherence

Proceedings Article | 18 September 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Diffraction, X-ray optics, Polishing, X-rays, X-ray microscopy, Image resolution, Ion beams, Atomic layer deposition, Zone plates, Hard x-rays

Proceedings Article | 18 September 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Diffraction, Lenses, Crystals, X-rays, Computer generated holography, Chemical elements, Hard x-rays, Binary data, Ion beam lithography, Absorption

Proceedings Article | 12 May 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Diffraction, X-ray optics, X-rays, Computer generated holography, Ion beams, Atomic layer deposition, Zone plates, Intelligence systems, Hard x-rays, Absorption

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