Dr. Uwe Apel
at Robert Bosch GmbH
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Chromatic aberrations, CMOS sensors, Edge detection, Detection and tracking algorithms, Imaging systems, Cameras, Sensors, Error analysis, Manufacturing, Inspection, Image sensors, Modulation transfer functions, Standards development

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