Dr. Uwe Wiedmann
at GE Research
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 March 2021 Presentation + Paper
Vasil Bogdan Neculaes, Uwe Wiedmann, Brian Yanoff, Jonathan Owens, Sharon Shwartz, Eliahu Cohen, Loucas Tsakalakos
Proceedings Volume 11700, 117003H (2021) https://doi.org/10.1117/12.2586972
KEYWORDS: X-rays, X-ray imaging, Nondestructive evaluation

Proceedings Article | 19 March 2014 Paper
Proceedings Volume 9033, 90332Z (2014) https://doi.org/10.1117/12.2043021
KEYWORDS: X-rays, X-ray computed tomography, Electrons, Optical filters, Switching, Capacitance, Signal attenuation, Modulation, Scanners, Image quality

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