Dr. Uwe Zscherpel
Senior Scientist at BAM Berlin
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 15 November 2018
Proc. SPIE. 10964, Tenth International Conference on Information Optics and Photonics
KEYWORDS: Signal to noise ratio, Sensors, X-rays, Radiography, Inspection, Nondestructive evaluation, Chromium, Image quality, Image filtering, X-ray imaging

Proceedings Article | 3 March 2000
Proc. SPIE. 3961, Nonlinear Image Processing XI
KEYWORDS: Statistical analysis, Image segmentation, Medical diagnostics, Radiography, Nondestructive evaluation, Image analysis, Medical imaging, Statistical modeling, Binary data, Model-based design

Proceedings Article | 1 March 1992
Proc. SPIE. 1575, 8th Intl Conf on Fourier Transform Spectroscopy
KEYWORDS: Near infrared, Zeolites, Diffuse reflectance spectroscopy, Silica, Molecules, Crystals, Fourier transforms, Physics, Deconvolution, Infrared radiation

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