V. G. Rajesh
at Model Engineering College
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7064, Interferometry XIV: Applications
KEYWORDS: Statistical analysis, Speckle, Metals, Manufacturing, Speckle pattern, Charge-coupled devices, Dynamical systems, Surface finishing, Time series analysis, Data analysis

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