Prof. Vadakke Matham Murukeshan
Associate Professor at Nanyang Technological Univ
SPIE Involvement:
Author
Publications (74)

PROCEEDINGS ARTICLE | August 22, 2017
Proc. SPIE. 10453, Third International Conference on Applications of Optics and Photonics

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Statistical analysis, Speckle, Calibration, Inspection, Surface roughness, Nondestructive evaluation, Additive manufacturing, Speckle pattern, Speckle metrology, Radium

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Speckle, Calibration, Error analysis, Surface roughness, Speckle pattern, Optical metrology, Machine vision, Optical resolution, Laser metrology, Laser optics

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Lithography, Optical lithography, Graphene, Interferometry, Near field, Flexible circuits

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Microscopes, Fiber optics, Imaging systems, Image quality, Beam shaping

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Carbon, Aerospace engineering, Glasses, Composites, Inspection, Nondestructive evaluation, Image analysis, Fractal analysis, Fiber reinforced polymers, Aircraft structures

Showing 5 of 74 publications
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