Dr. Valeriy V. Yashchuk
Staff Scientist at Lawrence Berkeley National Lab
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (68)

PROCEEDINGS ARTICLE | September 18, 2018
Proc. SPIE. 10761, Adaptive X-Ray Optics V
KEYWORDS: Mirrors, X-ray optics, Metrology, Error analysis, X-rays, Software development, Geometrical optics, Algorithm development, Optimization (mathematics), Grazing incidence

PROCEEDINGS ARTICLE | September 17, 2018
Proc. SPIE. 10760, Advances in X-Ray/EUV Optics and Components XIII
KEYWORDS: Mirrors, X-ray optics, Metrology, Sensors, Calibration, X-rays, Gaussian filters, Autocollimators

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Monochromatic aberrations, Visualization, Spatial frequencies, Interferometers, Modulation transfer functions, Fizeau interferometers

PROCEEDINGS ARTICLE | January 18, 2018
Proc. SPIE. 10612, Thirteenth International Conference on Correlation Optics
KEYWORDS: Mirrors, X-ray optics, Metrology, Switching, Sensors, Calibration, Error analysis, X-rays, Data acquisition, Deflectometry

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Light sources, X-ray optics, Metrology, Calibration, Microscopy, Interferometry, Optical testing, Optical metrology, Data processing

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Diffraction, Prisms, X-ray optics, Metrology, X-ray sources, Interferometry, Optical metrology, Synchrotrons, Free electron lasers, Coherent x-ray sources

Showing 5 of 68 publications
Conference Committee Involvement (11)
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics IV
9 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
Showing 5 of 11 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top