Dr. Valeriy V. Yashchuk
Staff Scientist at Lawrence Berkeley National Lab
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (68)

PROCEEDINGS ARTICLE | September 18, 2018
Proc. SPIE. 10761, Adaptive X-Ray Optics V
KEYWORDS: Mirrors, X-rays, Grazing incidence, Metrology, X-ray optics, Optimization (mathematics), Software development, Geometrical optics, Error analysis, Algorithm development

PROCEEDINGS ARTICLE | September 17, 2018
Proc. SPIE. 10760, Advances in X-Ray/EUV Optics and Components XIII
KEYWORDS: Mirrors, Calibration, Metrology, X-ray optics, X-rays, Autocollimators, Gaussian filters, Sensors

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Interferometers, Fizeau interferometers, Spatial frequencies, Modulation transfer functions, Visualization, Monochromatic aberrations

PROCEEDINGS ARTICLE | January 18, 2018
Proc. SPIE. 10612, Thirteenth International Conference on Correlation Optics
KEYWORDS: Mirrors, Metrology, Error analysis, X-ray optics, X-rays, Sensors, Calibration, Switching, Data acquisition, Deflectometry

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Metrology, Optical metrology, Interferometry, Microscopy, Calibration, Diffraction, Light sources, Data processing, Optical testing

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Metrology, Interferometry, Prisms, Optical metrology, Free electron lasers, Diffraction, Synchrotrons, Coherent x-ray sources, X-ray sources

Showing 5 of 68 publications
Conference Committee Involvement (11)
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics IV
9 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Computational Methods for X-Ray Optics III
19 August 2014 | San Diego, California, United States
Showing 5 of 11 published special sections
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