Veli-Tapani Peltoketo
Principal Engineer at Huawei Technologies Co Ltd
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 24 May 2018
Proc. SPIE. 10679, Optics, Photonics, and Digital Technologies for Imaging Applications V
KEYWORDS: Eye, Imaging systems, Cameras, Distortion, Quality measurement, Image quality, Image sensors, 3D metrology, Virtual reality, Panoramic photography

Proceedings Article | 29 April 2016
Proc. SPIE. 9896, Optics, Photonics and Digital Technologies for Imaging Applications IV
KEYWORDS: Digital signal processing, Visualization, Imaging systems, Cameras, Cameras, Sensors, Video, Image quality, Image quality, Image sensors, Digital imaging, 3D metrology, Spatial resolution, Head-mounted displays, Virtual reality, Prototyping, 3D image processing, New and emerging technologies

Proceedings Article | 8 February 2015
Proc. SPIE. 9396, Image Quality and System Performance XII
KEYWORDS: Signal to noise ratio, Cell phones, Cameras, Sensors, Image processing, Denoising, Image resolution, Optical testing, Image quality, Environmental sensing

SPIE Journal Paper | 21 July 2014
JEI Vol. 23 Issue 06
KEYWORDS: Cameras, Cell phones, Image quality, Signal to noise ratio, Measurement devices, Standards development, Image processing, Modulation transfer functions, Video, Visualization

Proceedings Article | 3 February 2014
Proc. SPIE. 9016, Image Quality and System Performance XI
KEYWORDS: Signal to noise ratio, Cell phones, Imaging systems, Cameras, Image processing, Video, Image quality, Measurement devices, Standards development, Image quality standards

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