Prof. Victor Bykov
at NT-MDT
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 July 2002 Paper
Proceedings Volume 4900, (2002) https://doi.org/10.1117/12.484562
KEYWORDS: Scanning probe microscopy, Oxides, Scanning tunneling microscopy, Atomic force microscopy, Silicon, Titanium, Nanotechnology, Chemical species, Nanolithography, Oxidation

Proceedings Article | 9 November 1999 Paper
V. Beklemyshev, V. Berezine, Victor Bykov, L. Kiselev, I. Makhonin, V. Pevgov, V. Pustovoy, A. Semynov, Y. Sencov, I. Shkuropat, A. Shokin
Proceedings Volume 3903, (1999) https://doi.org/10.1117/12.369449

Proceedings Article | 9 November 1999 Paper
V. Beklemyshev, V. Berezine, Victor Bykov, L. Kiselev, I. Makhonin, V. Pevgov, V. Pustovoy, A. Semynov, Y. Sencov, I. Shkuropat, A. Shokin
Proceedings Volume 3903, (1999) https://doi.org/10.1117/12.369448

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top