Dr. Victor J. Orphan
Senior Vice President for Corp. Development at Science Applications International Corp
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (3)

PROCEEDINGS ARTICLE | February 27, 1997
Proc. SPIE. 2867, International Conference Neutrons in Research and Industry
KEYWORDS: Sensors, Image processing, Scanners, Radiography, Inspection, Collimators, Telecommunications, Signal processing, Gamma radiation, Signal detection

PROCEEDINGS ARTICLE | February 6, 1997
Proc. SPIE. 2936, Physics-Based Technologies for the Detection of Contraband
KEYWORDS: Sensors, Scanners, Radiography, Reliability, Inspection, Fourier transforms, Detector development, Gamma radiation, Velocity measurements, Data communications

SPIE Conference Volume | December 16, 1993

Conference Committee Involvement (3)
Non-Intrusive Inspection Technologies
17 April 2006 | Orlando (Kissimmee), Florida, United States
Hard X-Ray and Gamma-Ray Detector Physics V
4 August 2003 | San Diego, California, United States
X-Ray Detector Physics and Applications II
13 July 1993 | San Diego, CA, United States
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